Inventor · disambiguated record
Alex Dikopoltsev
Also filed as: DIKOPOLTSEV ALEX
15 granted patents·2 pending applications·145 citations·filing 2003–2024
92Inventor score
Files withJORDAN VALLEY APPLIED RADIATION LTD5BRUKER TECH LTD4BRUKER JV ISRAEL LTD2JORDAN VALLEY SEMICONDUCTORS2JORDAN VALLEY SEMICONDUCTORS LTD2
Top patents by PatentIndex Score
17 records- 0194US9606073B2X-ray scatterometry apparatusJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Mar 28, 2017·17 cites·20 claims
- 0292US11181490B2Small-angle x-ray scatterometryBRUKER TECH LTD·Filed 2019·Granted Nov 23, 2021·10 cites·25 claims
- 0392US7481579B2Overlay metrology using X-raysJORDAN VALLEY APPLIED RADIATION LTD·Filed 2006·Granted Jan 27, 2009·23 cites·12 claims
- 0491US9829448B2Measurement of small features using XRFJORDAN VALLEY SEMICONDUCTORS LTD·Filed 2015·Granted Nov 28, 2017·8 cites·20 claims
- 0591US7130376B2X-ray reflectometry of thin film layers with enhanced accuracyJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Oct 31, 2006·17 cites·34 claims
- 0691US7103142B1Material analysis using multiple X-ray reflectometry modelsJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Sep 5, 2006·19 cites·30 claims
- 0788US7245695B2Detection of dishing and tilting using X-ray fluorescenceJORDAN VALLEY APPLIED RADIATION LTD·Filed 2005·Granted Jul 17, 2007·14 cites·25 claims
- 0884US7062013B2X-ray reflectometry of thin film layers with enhanced accuracyJORDAN VALLEY APPLIED RADIATION LTD·Filed 2003·Granted Jun 13, 2006·24 cites·14 claims
- 0981US7649978B2Automated selection of X-ray reflectometry measurement locationsJORDAN VALLEY SEMICONDUCTORS·Filed 2008·Granted Jan 19, 2010·7 cites·20 claims
- 1078US12085521B2Small-angle X-ray scatterometryBRUKER TECH LTD·Filed 2023·Granted Sep 10, 2024·0 cites·16 claims
- 1178US10684238B2Method and apparatus for X-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2017·Granted Jun 16, 2020·3 cites·5 claims
- 1277US2024377342A1Small-Angle X-Ray ScatterometryBRUKER TECH LTD·Filed 2024·Application pending·0 cites
- 1376US9389192B2Estimation of XRF intensity from an array of micro-bumpsJORDAN VALLEY SEMICONDUCTORS·Filed 2014·Granted Jul 12, 2016·2 cites·17 claims
- 1471US11703464B2Small-angle x-ray scatterometryBRUKER TECH LTD·Filed 2021·Granted Jul 18, 2023·0 cites·19 claims
- 1558US10177841B2Electro-optic transceiver module with wavelength compensationMELLANOX TECHNOLOGIES LTD·Filed 2016·Granted Jan 8, 2019·1 cites·20 claims
- 1655US11169099B2Method and apparatus for X-ray scatterometryBRUKER JV ISRAEL LTD·Filed 2019·Granted Nov 9, 2021·0 cites·19 claims
- 1746US2007274447A1Automated selection of X-ray reflectometry measurement locationsMAZOR ISAAC·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →