Inventor · disambiguated record
Alon Eyal
Also filed as: EYAL ALON
13 granted patents·133 citations·filing 2015–2023
91Inventor score
Top patents by PatentIndex Score
13 records- 0198US9947401B1Peak current management in non-volatile storageSANDISK TECHNOLOGIES LLC·Filed 2016·Granted Apr 17, 2018·53 cites·19 claims
- 0295US9952944B1First read solution for memorySANDISK TECHNOLOGIES LLC·Filed 2016·Granted Apr 24, 2018·14 cites·13 claims
- 0394US10090044B2System and method for burst programming directly to MLC memorySANDISK TECHNOLOGIES LLC·Filed 2016·Granted Oct 2, 2018·14 cites·20 claims
- 0492US9704595B1Self-detecting a heating event to non-volatile storageSANDISK TECHNOLOGIES INC·Filed 2016·Granted Jul 11, 2017·14 cites·20 claims
- 0591US11043266B1Multi-level read after heating event in non-volatile storageWESTERN DIGITAL TECH INC·Filed 2020·Granted Jun 22, 2021·7 cites·21 claims
- 0691US10564900B2Temperature variation compensationWESTERN DIGITAL TECH INC·Filed 2018·Granted Feb 18, 2020·9 cites·20 claims
- 0788US10446242B2Temperature variation compensationWESTERN DIGITAL TECH INC·Filed 2017·Granted Oct 15, 2019·8 cites·20 claims
- 0885US11194523B2Temperature variation compensationWESTERN DIGITAL TECH INC·Filed 2020·Granted Dec 7, 2021·2 cites·20 claims
- 0982US10394649B2First read solution for memorySANDISK TECHNOLOGIES LLC·Filed 2018·Granted Aug 27, 2019·2 cites·19 claims
- 1081US10262743B2Command sequence for first read solution for memorySANDISK TECHNOLOGIES LLC·Filed 2017·Granted Apr 16, 2019·5 cites·20 claims
- 1173US10372536B2First read solution for memorySANDISK TECHNOLOGIES LLC·Filed 2018·Granted Aug 6, 2019·2 cites·18 claims
- 1271US9865360B2Burn-in memory testingSANDISK TECHNOLOGIES INC·Filed 2015·Granted Jan 9, 2018·3 cites·42 claims
- 1359US12444472B2Light-weight BES approximationSANDISK TECHNOLOGIES INC·Filed 2023·Granted Oct 14, 2025·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →