Inventor · disambiguated record
Alexander Henstra
Also filed as: HENSTRA ALEXANDER
45 granted patents·13 pending applications·382 citations·filing 1995–2025
97Inventor score
Top patents by PatentIndex Score
58 records- 0196US11460419B2Electron diffraction holographyFEI CO·Filed 2020·Granted Oct 4, 2022·4 cites·20 claims
- 0296US11183364B1Dual beam microscope system for imaging during sample processingFEI CO·Filed 2020·Granted Nov 23, 2021·7 cites·19 claims
- 0395US11906450B2Electron diffraction holographyFEI CO·Filed 2022·Granted Feb 20, 2024·2 cites·20 claims
- 0492US7378667B2Particle-optical appliance provided with aberration-correcting meansFEI CO·Filed 2006·Granted May 27, 2008·21 cites·25 claims
- 0590US8461525B2Charged particle source with integrated energy filterHENSTRA ALEXANDER·Filed 2011·Granted Jun 11, 2013·11 cites·9 claims
- 0689US7999225B2Charged particle source with integrated energy filterFEI CO·Filed 2009·Granted Aug 16, 2011·10 cites·17 claims
- 0789US7034315B2Particle source with selectable beam current and energy spreadFEI CO·Filed 2005·Granted Apr 25, 2006·30 cites·16 claims
- 0887US12216068B2Bifocal electron microscopeFEI CO·Filed 2024·Granted Feb 4, 2025·0 cites·20 claims
- 0987US2025391649A1EELS Auto-Alignment Using Full Image SimulationFEI CO·Filed 2025·Application pending·0 cites
- 1083US11114271B2Sixth-order and above corrected STEM multipole correctorsFEI CO·Filed 2019·Granted Sep 7, 2021·3 cites·20 claims
- 1183US9048060B2Beam pulsing device for use in charged-particle microscopyFEI CO·Filed 2013·Granted Jun 2, 2015·10 cites·20 claims
- 1283US6218664B1SEM provided with an electrostatic objective and an electrical scanning deviceFEI CO·Filed 1998·Granted Apr 17, 2001·48 cites·6 claims
- 1383US5838011ACorrection device for the correction of lens aberrations in particle-optical apparatusPHILIPS CORP·Filed 1997·Granted Nov 17, 1998·53 cites·12 claims
- 1481US11239045B1Method and system for correcting two-fold, fifth-order parasitic aberrations in charged particle systemsFEI CO·Filed 2020·Granted Feb 1, 2022·1 cites·20 claims
- 1581US9741525B1Charged-particle microscope with astigmatism compensation and energy-selectionFEI CO·Filed 2016·Granted Aug 22, 2017·3 cites·16 claims
- 1681US8598542B2Charged particle beam processingTOTH MILOS·Filed 2010·Granted Dec 3, 2013·5 cites·8 claims
- 1780US9978561B2Post column filter with enhanced energy rangeFEI CO·Filed 2016·Granted May 22, 2018·2 cites·20 claims
- 1880US8841630B2Corrector for axial aberrations of a particle-optical lensHENSTRA ALEXANDER·Filed 2010·Granted Sep 23, 2014·5 cites·16 claims
- 1979US12505996B2EELS auto-alignment using full image simulationFEI CO·Filed 2022·Granted Dec 23, 2025·0 cites·20 claims
- 2079US10559448B2Transmission charged particle microscope with improved EELS/EFTEM moduleFEI CO·Filed 2018·Granted Feb 11, 2020·2 cites·9 claims
- 2179US5986269ACorrection device for correcting chromatic aberration in particle-optical apparatusPHILIPS CORP·Filed 1997·Granted Nov 16, 1999·35 cites·12 claims
- 2278US10410827B2Gun lens design in a charged particle microscopeFEI CO·Filed 2017·Granted Sep 10, 2019·2 cites·15 claims
- 2378US8710452B2Charged particle source with integrated electrostatic energy filterHENSTRA ALEXANDER·Filed 2011·Granted Apr 29, 2014·4 cites·20 claims
- 2478US6184975B1Electrostatic device for correcting chromatic aberration in a particle-optical apparatusPHILIPS ELECTRON OPTICS BV·Filed 1998·Granted Feb 6, 2001·34 cites·3 claims
- 2578US5578822AParticle-optical apparatus comprising a detector for secondary electronsPHILIPS CORP·Filed 1995·Granted Nov 26, 1996·34 cites·7 claims
- 2677US11915904B2Reduction of thermal magnetic field noise in TEM corrector systemsFEI CO·Filed 2022·Granted Feb 27, 2024·0 cites·20 claims
- 2775US2023207254A1Electron microscope with improved imaging resolutionFEI CO·Filed 2023·Application pending·0 cites
- 2874US2025155387A1Bifocal electron microscopeFEI CO·Filed 2025·Application pending·0 cites
- 2973US10825644B1Corrector transfer optics for Lorentz EMFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·15 claims
- 3073US8569693B2Distortion free stigmation of a TEMBISCHOFF MAARTEN·Filed 2012·Granted Oct 29, 2013·4 cites·14 claims
- 3172US11437216B2Reduction of thermal magnetic field noise in TEM corrector systemsFEI CO·Filed 2020·Granted Sep 6, 2022·0 cites·20 claims
- 3272US6455848B1Particle-optical apparatus involving detection of Auger electronicsKONINKL PHILIPS ELECTRONICS NV·Filed 1999·Granted Sep 24, 2002·24 cites·8 claims
- 3365US5965894AMethod of operating a particle-optical apparatusPHILIPS CORP·Filed 1997·Granted Oct 12, 1999·19 cites·10 claims
- 3463US11456149B2Methods and systems for acquiring 3D diffraction dataFEI CO·Filed 2020·Granted Sep 27, 2022·0 cites·19 claims
- 3563US8884245B2Corrector for the correction of chromatic aberrations in a particle-optical apparatusHENSTRA ALEXANDER·Filed 2006·Granted Nov 11, 2014·1 cites·15 claims
- 3662US11715618B2System and method for reducing the charging effect in a transmission electron microscope systemFEI CO·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 3761US2025112018A1Aberration correction systems and charged particle microscope systems including the sameFEI CO·Filed 2023·Application pending·0 cites
- 3860US2024249905A1Techniques for narrowing zero loss peaks in monochromated charged particles sourcesFEI CO·Filed 2024·Application pending·0 cites
- 3960US2020013580A1Electron microscope with improved imaging resolutionFEI CO·Filed 2019·Application pending·0 cites
- 4059US2025391629A1Aberration correction in charged particle spectroscopyFEI CO·Filed 2024·Application pending·0 cites
- 4158US12505975B2Focused ion beam system and methodFEI CO·Filed 2023·Granted Dec 23, 2025·0 cites·16 claims
- 4258US10431420B2Post column filter with enhanced energy rangeFEI CO·Filed 2018·Granted Oct 1, 2019·0 cites·18 claims
- 4357US12362132B2Simple spherical aberration corrector for SEMFEI CO·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 4457US11815476B2Methods and systems for acquiring three-dimensional electron diffraction dataFEI CO·Filed 2021·Granted Nov 14, 2023·0 cites·21 claims
- 4557US11404241B2Simultaneous TEM and STEM microscopeFEI CO·Filed 2020·Granted Aug 2, 2022·0 cites·20 claims
- 4657US2025112019A1Multipole elements and charged particle microscope systems including the sameFEI CO·Filed 2023·Application pending·0 cites
- 4757US2025112016A1Aberration correction systems and charged particle microscope systems including the sameFEI CO·Filed 2023·Application pending·0 cites
- 4856US2023215682A1Electrostatic mirror chromatic aberration correctorsFEI CO·Filed 2022·Application pending·0 cites
- 4955US12100585B2Energy spectrometer with dynamic focusFEI CO·Filed 2021·Granted Sep 24, 2024·0 cites·14 claims
- 5055US11450505B2Magnetic field free sample plane for charged particle microscopeFEI CO·Filed 2020·Granted Sep 20, 2022·0 cites·23 claims
Showing the top 50 of 58 patent records by PatentIndex Score.
Join the waitlist — get patent alerts
Get an alert when Alexander Henstra files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →