Inventor · disambiguated record
Alan E. Humphrey
Also filed as: HUMPHREY ALAN · HUMPHREY ALAN E · HUMPHREY ALAN EUGENE
25 granted patents·12 pending applications·529 citations·filing 1980–2021
96Inventor score
Top patents by PatentIndex Score
37 records- 0198US10896828B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2020·Granted Jan 19, 2021·6 cites·27 claims
- 0297US11035898B1Device and method for thermal stabilization of probe elements using a heat conducting waferINT TEST SOLUTIONS INC·Filed 2020·Granted Jun 15, 2021·7 cites·30 claims
- 0397US10406568B2Working surface cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Granted Sep 10, 2019·9 cites·8 claims
- 0495US10109504B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2017·Granted Oct 23, 2018·8 cites·4 claims
- 0595US9833818B2Working surface cleaning system and methodINT TEST SOLUTIONS INC·Filed 2013·Granted Dec 5, 2017·13 cites·8 claims
- 0694US10792713B1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Granted Oct 6, 2020·11 cites·13 claims
- 0794US10741420B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2018·Granted Aug 11, 2020·6 cites·7 claims
- 0894US10195648B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareINT TEST SOLUTIONS INC·Filed 2014·Granted Feb 5, 2019·15 cites·10 claims
- 0994US9825000B1Semiconductor wire bonding machine cleaning device and methodINT TEST SOLUTIONS INC·Filed 2017·Granted Nov 21, 2017·16 cites·30 claims
- 1094US9595456B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2013·Granted Mar 14, 2017·11 cites·18 claims
- 1194US8371316B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareINT TEST SOLUTIONS INC·Filed 2009·Granted Feb 12, 2013·22 cites·15 claims
- 1292US10002776B2Wafer manufacturing cleaning apparatus, process and method of useINT TEST SOLUTIONS INC·Filed 2012·Granted Jun 19, 2018·9 cites·23 claims
- 1391US10239099B2Working surface cleaning system and methodINT TEST SOLUTIONS INC·Filed 2017·Granted Mar 26, 2019·3 cites·8 claims
- 1491US8801869B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareBROZ JERRY J·Filed 2011·Granted Aug 12, 2014·17 cites·8 claims
- 1591US6777966B1Cleaning system, device and methodINT TEST SOLUTIONS INC·Filed 2000·Granted Aug 17, 2004·51 cites·28 claims
- 1691US4306621AMethod for in situ coal gasification operationsBOYD R MICHAEL·Filed 1980·Granted Dec 22, 1981·298 cites·32 claims
- 1790US10361169B2Semiconductor wire bonding machine cleaning device and methodINT TEST SOLUTIONS INC·Filed 2017·Granted Jul 23, 2019·8 cites·23 claims
- 1889US10843885B2Material and hardware to automatically clean flexible electronic web rollsINT TEST SOLUTIONS INC·Filed 2019·Granted Nov 24, 2020·2 cites·15 claims
- 1988US8790466B2Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareHUMPHREY ALAN E·Filed 2011·Granted Jul 29, 2014·16 cites·10 claims
- 2084US10717618B2Material and hardware to automatically clean flexible electronic web rollsINT TEST SOLUTIONS INC·Filed 2019·Granted Jul 21, 2020·1 cites·17 claims
- 2172US11434095B2Material and hardware to automatically clean flexible electronic web rollsINT TEST SOLUTIONS INC·Filed 2019·Granted Sep 6, 2022·0 cites·5 claims
- 2271US11155428B2Material and hardware to automatically clean flexible electronic web rollsINT TEST SOLUTIONS INC·Filed 2019·Granted Oct 26, 2021·0 cites·10 claims
- 2358US11756811B2Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Granted Sep 12, 2023·0 cites·12 claims
- 2458US2022093394A1System and method for cleaning contact elements and support hardware using functionalized surface microfeaturesINT TEST SOLUTIONS LLC·Filed 2021·Application pending·0 cites
- 2557US2021005484A1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2020·Application pending·0 cites
- 2654US11211242B2System and method for cleaning contact elements and support hardware using functionalized surface microfeaturesINT TEST SOLUTIONS INC·Filed 2019·Granted Dec 28, 2021·0 cites·11 claims
- 2753US2010132736A1Test Cell Conditioner (TCC) Surrogate Cleaning DeviceJTRON TECHNOLOGY CORP·Filed 2009·Application pending·0 cites
- 2851US2006001438A1Cleaning system, device and methodINT TEST SOLUTIONS INC·Filed 2005·Application pending·0 cites
- 2949US2010258144A1Wafer manufacturing cleaning apparatus, process and method of useINTERNAT TEST SOLUTIONS·Filed 2010·Application pending·0 cites
- 3044US11318550B2System and method for cleaning wire bonding machines using functionalized surface microfeaturesINT TEST SOLUTIONS INC·Filed 2020·Granted May 3, 2022·0 cites·6 claims
- 3143US2003200989A1Cleaning system, device and methodINT TEST SOLUTIONS INC·Filed 2003·Application pending·0 cites
- 3243US2021005499A1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Application pending·0 cites
- 3343US2015360603A1Flashing Brake Light SystemMINER DEAN A·Filed 2014·Application pending·0 cites
- 3443US2020200800A1Apparatuses, device, and methods for cleaning tester interface contact elements and support hardwareINT TEST SOLUTIONS·Filed 2018·Application pending·0 cites
- 3543US2021001378A1Pick and place machine cleaning system and methodINT TEST SOLUTIONS INC·Filed 2019·Application pending·0 cites
- 3642US2006065290A1Working surface cleaning system and methodBROZ JERRY·Filed 2005·Application pending·0 cites
- 3739US2005196900A1Substrate protection system, device and methodFiled 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →