Inventor · disambiguated record
Alexander Prasetya Konijnenberg
Also filed as: Konijnenberg Alexander Prasetya
4 granted patents·5 pending applications·1 citations·filing 2017–2023
56Inventor score
Files withASML NETHERLANDS BV9
Top patents by PatentIndex Score
9 records- 0175US12493247B2Method and system for predicting process information with a parameterized modelASML NETHERLANDS BV·Filed 2020·Granted Dec 9, 2025·1 cites·13 claims
- 0259US12164233B2Metrology method and apparatus for of determining a complex-valued fieldASML NETHERLANDS BV·Filed 2020·Granted Dec 10, 2024·0 cites·14 claims
- 0357US12117734B2Metrology method and device for determining a complex-valued fieldASML NETHERLANDS BV·Filed 2020·Granted Oct 15, 2024·0 cites·15 claims
- 0454US2024004313A1Method and apparatus for imaging nonstationary objectASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 0554US2025231498A1Imaging method and metrology deviceASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0652US2025138436A1Metrology method and deviceASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0751US2024152060A1Method and system for predicting process information with a parameterized modelASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 0848US2023064193A1Metrology method and device for measuring a periodic structure on a substrateASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 0947US10234384B2Inspection apparatus and method, lithographic apparatus, method of manufacturing devices and computer programASML NETHERLANDS BV·Filed 2017·Granted Mar 19, 2019·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →