Inventor · disambiguated record
Alon Litman
Also filed as: LITMAN ALON
32 granted patents·2 pending applications·384 citations·filing 1994–2024
96Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD28OPAL TECHNOLOGIES LTD2APPILED MATERIALS INC1APPLIED MATERIALS INC1CHIRKO KONSTANTINE1
Top patents by PatentIndex Score
34 records- 0196US10903044B1Filling empty structures with deposition under high-energy SEM for uniform DE layeringAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jan 26, 2021·8 cites·20 claims
- 0295US11366072B2Detecting backscattered electrons in a multibeam charged particle columnAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Jun 21, 2022·4 cites·16 claims
- 0395US9666412B1Method for charging and imaging an objectAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted May 30, 2017·18 cites·12 claims
- 0495US7468506B2Spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·55 cites·20 claims
- 0594US7468507B2Optical spot grid array scanning systemAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Dec 23, 2008·37 cites·18 claims
- 0694US7285779B2Methods of scanning an object that includes multiple regions of interest using an array of scanning beamsAPPLIED MATERIALS ISRAEL LTD·Filed 2005·Granted Oct 23, 2007·30 cites·18 claims
- 0792US5644132ASystem for high resolution imaging and measurement of topographic and material features on a specimenOPAL TECHNOLOGIES LTD·Filed 1995·Granted Jul 1, 1997·107 cites·9 claims
- 0891US9818577B2Multi mode system with a dispersion X-ray detectorAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Nov 14, 2017·7 cites·17 claims
- 0989US7521700B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Apr 21, 2009·10 cites·12 claims
- 1086US7842935B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS ISRAEL LTD·Filed 2006·Granted Nov 30, 2010·7 cites·66 claims
- 1186US5466940AElectron detector with high backscattered electron acceptance for particle beam apparatusOPAL TECHNOLOGIES LTD·Filed 1994·Granted Nov 14, 1995·55 cites·29 claims
- 1281US8207499B2Variable rate scanning in an electron microscopeSHOHAM AMIR·Filed 2008·Granted Jun 26, 2012·8 cites·12 claims
- 1379US11264202B2Generating three dimensional information regarding structural elements of a specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Mar 1, 2022·1 cites·20 claims
- 1478US7098468B2Raster frame beam system for electron beam lithographyAPPLIED MATERIALS INC·Filed 2003·Granted Aug 29, 2006·14 cites·66 claims
- 1574US10211026B2Retractable detectorAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Feb 19, 2019·1 cites·20 claims
- 1674US9632044B1Imaging bottom of high aspect ratio holesAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Apr 25, 2017·2 cites·13 claims
- 1770US9466462B2Inspection of regions of interest using an electron beam systemAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Oct 11, 2016·2 cites·13 claims
- 1868US7430104B2Electrostatic chuck for wafer metrology and inspection equipmentAPPILED MATERIALS INC·Filed 2003·Granted Sep 30, 2008·13 cites·26 claims
- 1965US10074513B2Multi mode systems with retractable detectorsAPPLIED MATERIALS ISRAEL LTD·Filed 2017·Granted Sep 11, 2018·1 cites·16 claims
- 2064US10714305B2Retractable detectorAPPLIED MATERIALS ISRAEL LTD·Filed 2019·Granted Jul 14, 2020·0 cites·20 claims
- 2157US2024387140A1Multiple electron beam opticsAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 2257US2025391707A1Method and system for 3d reconstruction of wafer structure by diagonal millingAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 2356US11501951B1X-ray imaging in cross-section using un-cut lamella with background materialAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Nov 15, 2022·0 cites·20 claims
- 2455US9366954B2Inspection of a lithographic mask that is protected by a pellicleAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Jun 14, 2016·0 cites·8 claims
- 2553US10156785B2Inspection of a lithographic mask that is protected by a pellicleAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 18, 2018·0 cites·10 claims
- 2652US11315754B2Adaptive geometry for optimal focused ion beam etchingAPPLIED MATERIALS ISRAEL LTD·Filed 2020·Granted Apr 26, 2022·0 cites·18 claims
- 2750US6914443B2Apparatus and method for enhanced voltage contrast analysisAPPLIED MATERIALS ISRAEL LTD·Filed 2003·Granted Jul 5, 2005·4 cites·72 claims
- 2848US9470751B2Detecting open and short of conductorsAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Oct 18, 2016·0 cites·18 claims
- 2947US9297692B2System and method for inspecting a sample using landing lensAPPLIED MATERIALS ISRAEL LTD·Filed 2013·Granted Mar 29, 2016·0 cites·20 claims
- 3045US9448253B2Determining a state of a high aspect ratio hole using measurement results from an electrostatic measurement deviceAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Sep 20, 2016·0 cites·17 claims
- 3144US9847209B2Inspection of regions of interest using an electron beam systemAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Dec 19, 2017·0 cites·20 claims
- 3243US9958501B1System for electrical measurements of objects in a vacuumed environmentAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted May 1, 2018·0 cites·16 claims
- 3328US10541104B2System and method for scanning an object with an electron beam using overlapping scans and electron beam counter-deflectionAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Jan 21, 2020·0 cites·19 claims
- 3425US8389962B2System and method for compensating for magnetic noiseCHIRKO KONSTANTINE·Filed 2011·Granted Mar 5, 2013·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →