Inventor · disambiguated record
Albertus Victor Gerardus Mangnus
Also filed as: MANGNUS ALBERTUS VICTOR GERARDUS
14 granted patents·11 pending applications·5 citations·filing 2018–2025
84Inventor score
Files withASML NETHERLANDS BV25
Top patents by PatentIndex Score
25 records- 0195US11821859B2Charged particle optical device, objective lens assembly, detector, detector array, and methodsASML NETHERLANDS BV·Filed 2021·Granted Nov 21, 2023·3 cites·20 claims
- 0283US12422387B2Charged particle optical device, objective lens assembly, detector, detector array, and methodsASML NETHERLANDS BV·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 0382US2025349504A1Charged particle device, detector, and methodsASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 0479US12125671B2Multi-source charged particle illumination apparatusASML NETHERLANDS BV·Filed 2020·Granted Oct 22, 2024·1 cites·20 claims
- 0576US11442368B2Inspection tool, inspection method and computer program productASML NETHERLANDS BV·Filed 2019·Granted Sep 13, 2022·1 cites·20 claims
- 0672US12394589B2Charged particle device, detector, and methodsASML NETHERLANDS BV·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 0762US12230469B2Apparatus for and method of local control of a charged particle beamASML NETHERLANDS BV·Filed 2021·Granted Feb 18, 2025·0 cites·20 claims
- 0858US2024087844A1Charged particle optical device, objective lens assembly, detector, detector array, and methodsASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0958US2024087835A1Charged particle device and methodASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1058US2024128043A1Charged particle apparatus and methodASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 1157US11881374B2Apparatus for and method of controlling an energy spread of a charged-particle beamASML NETHERLANDS BV·Filed 2020·Granted Jan 23, 2024·0 cites·15 claims
- 1257US2024339294A1Charged-particle optical apparatus and projection methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1357US2024339292A1Charged particle device, charged particle assessment apparatus, measuring method, and monitoring methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1457US2024331968A1Charged-particle apparatus, multi-device apparatus, method of using charged-particle apparatus and control methodASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 1556US2024280517A1Charged particle detectorASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1656US2024272312A1Charged particle detector assemblyASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 1754US11961700B2Systems and methods for image enhancement for a multi-beam charged-particle inspection systemASML NETHERLANDS BV·Filed 2020·Granted Apr 16, 2024·0 cites·15 claims
- 1854US11942302B2Pulsed charged-particle beam systemASML NETHERLANDS BV·Filed 2019·Granted Mar 26, 2024·0 cites·15 claims
- 1952US11243179B2Inspection tool, lithographic apparatus, electron beam source and an inspection methodASML NETHERLANDS BV·Filed 2018·Granted Feb 8, 2022·0 cites·20 claims
- 2048US11942303B2Systems and methods for real time stereo imaging using multiple electron beamsASML NETHERLANDS BV·Filed 2019·Granted Mar 26, 2024·0 cites·14 claims
- 2148US2023048580A1Apparatus for and method of control of a charged particle beamASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 2247US12325911B2Method and apparatus for forming a patterned layer of materialASML NETHERLANDS BV·Filed 2020·Granted Jun 10, 2025·0 cites·17 claims
- 2346US11791132B2Aperture array with integrated current measurementASML NETHERLANDS BV·Filed 2020·Granted Oct 17, 2023·0 cites·18 claims
- 2443US12313980B2Inspection system, lithographic apparatus, and inspection methodASML NETHERLANDS BV·Filed 2019·Granted May 27, 2025·0 cites·20 claims
- 2541US2021249224A1Electron beam apparatus, inspection tool and inspection methodASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
Join the waitlist — get patent alerts
Get an alert when Albertus Victor Gerardus Mangnus files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →