Inventor · disambiguated record
Ali Mohammadi-Gheidari
Also filed as: MOHAMMADI-GHEIDARI ALI
11 granted patents·5 pending applications·11 citations·filing 2013–2024
82Inventor score
Top patents by PatentIndex Score
16 records- 0186US10607811B1Multi-beam scanning transmission charged particle microscopeFEI CO·Filed 2019·Granted Mar 31, 2020·4 cites·12 claims
- 0284US10453647B2Emission noise correction of a charged particle sourceFEI CO·Filed 2017·Granted Oct 22, 2019·4 cites·22 claims
- 0378US10410827B2Gun lens design in a charged particle microscopeFEI CO·Filed 2017·Granted Sep 10, 2019·2 cites·15 claims
- 0474US11961709B2Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2022·Granted Apr 16, 2024·0 cites·20 claims
- 0574US10971326B2Multi-electron-beam imaging apparatus with improved performanceFEI CO·Filed 2019·Granted Apr 6, 2021·1 cites·12 claims
- 0660US2020273667A1Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2020·Application pending·0 cites
- 0760US2024249905A1Techniques for narrowing zero loss peaks in monochromated charged particles sourcesFEI CO·Filed 2024·Application pending·0 cites
- 0857US12362132B2Simple spherical aberration corrector for SEMFEI CO·Filed 2022·Granted Jul 15, 2025·0 cites·20 claims
- 0956US2023215682A1Electrostatic mirror chromatic aberration correctorsFEI CO·Filed 2022·Application pending·0 cites
- 1055US11450505B2Magnetic field free sample plane for charged particle microscopeFEI CO·Filed 2020·Granted Sep 20, 2022·0 cites·23 claims
- 1154US12394587B2Simple spherical aberration corrector for SEMFEI CO·Filed 2022·Granted Aug 19, 2025·0 cites·20 claims
- 1251US11804357B2Electron optical module for providing an off-axial electron beam with a tunable comaFEI CO·Filed 2021·Granted Oct 31, 2023·0 cites·19 claims
- 1349US9697985B2Apparatus and method for inspecting a surface of a sampleUNIV DELFT TECH·Filed 2013·Granted Jul 4, 2017·0 cites·18 claims
- 1448US10790113B2Multi-beam charged particle imaging apparatusFEI CO·Filed 2019·Granted Sep 29, 2020·0 cites·15 claims
- 1545US2021305007A1Dual beam bifocal charged particle microscopeFEI CO·Filed 2020·Application pending·0 cites
- 1642US2020373115A1Multi-beam scanning electron microscopeFEI CO·Filed 2019·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →