Inventor · disambiguated record
Alan Nolet
Also filed as: NOLET ALAN · NOLET ALAN P
4 granted patents·1 pending application·27 citations·filing 2004–2018
74Inventor score
Top patents by PatentIndex Score
5 records- 0192US10593562B2Method for creating through-connected vias and conductors on a substrateSAMTEC INC·Filed 2018·Granted Mar 17, 2020·5 cites·18 claims
- 0286US7444196B2Optimized characterization of wafers structures for optical metrologyTIMBRE TECH INC·Filed 2006·Granted Oct 28, 2008·10 cites·32 claims
- 0365US7515282B2Modeling and measuring structures with spatially varying properties in optical metrologyTIMBRE TECH INC·Filed 2005·Granted Apr 7, 2009·5 cites·19 claims
- 0459US7566181B2Controlling critical dimensions of structures formed on a wafer in semiconductor processingTOKYO ELECTRON LTD·Filed 2004·Granted Jul 28, 2009·7 cites·24 claims
- 0545US2009011679A1Method of removal profile modulation in cmp padsBAJAJ RAJEEV·Filed 2008·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →