Inventor · disambiguated record
Alain G. Rwabukamba
Also filed as: RWABUKAMBA ALAIN G
2 granted patents·0 citations·filing 2016–2018
26Inventor score
Technology areasG01R
Files withIBM2
Top patents by PatentIndex Score
2 records- 0158US10768226B2Testing mechanism for a proximity fail probability of defects across integrated chipsIBM·Filed 2018·Granted Sep 8, 2020·0 cites·16 claims
- 0251US10114071B2Testing mechanism for a proximity fail probability of defects across integrated chipsIBM·Filed 2016·Granted Oct 30, 2018·0 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →