Inventor · disambiguated record
Alexander Savtchouk
Also filed as: SAVTCHOUK ALEXANDER
5 granted patents·561 citations·filing 1999–2001
87Inventor score
Files withSEMICONDUCTOR DIAGNOSTICS INC5
Top patents by PatentIndex Score
5 records- 0196US6680621B2Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage currentSEMICONDUCTOR DIAGNOSTICS INC·Filed 2001·Granted Jan 20, 2004·133 cites·62 claims
- 0296US6597193B2Steady state method for measuring the thickness and the capacitance of ultra thin dielectric in the presence of substantial leakage currentSEMICONDUCTOR DIAGNOSTICS INC·Filed 2001·Granted Jul 22, 2003·129 cites·27 claims
- 0392US6569691B1Measurement of different mobile ion concentrations in the oxide layer of a semiconductor waferSEMICONDUCTOR DIAGNOSTICS INC·Filed 2000·Granted May 27, 2003·72 cites·35 claims
- 0490US6114865ADevice for electrically contacting a floating semiconductor wafer having an insulating filmSEMICONDUCTOR DIAGNOSTICS INC·Filed 1999·Granted Sep 5, 2000·132 cites·19 claims
- 0588US6538462B1Method for measuring stress induced leakage current and gate dielectric integrity using corona dischargeSEMICONDUCTOR DIAGNOSTICS INC·Filed 1999·Granted Mar 25, 2003·95 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →