Inventor · disambiguated record
Alexander Ypma
Also filed as: YPMA ALEXANDER
35 granted patents·7 pending applications·137 citations·filing 2006–2025
96Inventor score
Top patents by PatentIndex Score
42 records- 0197US11940740B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2022·Granted Mar 26, 2024·2 cites·20 claims
- 0297US10642162B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2019·Granted May 5, 2020·8 cites·23 claims
- 0397US9946165B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2014·Granted Apr 17, 2018·19 cites·20 claims
- 0496US10274834B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2018·Granted Apr 30, 2019·15 cites·20 claims
- 0593US10474045B2Lithographic apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2016·Granted Nov 12, 2019·6 cites·20 claims
- 0691US7590530B2Method and apparatus for improved estimation of non-stationary noise for speech enhancementGN RESOUND AS·Filed 2006·Granted Sep 15, 2009·45 cites·19 claims
- 0787US12287584B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2023·Granted Apr 29, 2025·0 cites·20 claims
- 0886US9084066B2Optimization of hearing aid parametersDE VRIES AALBERT·Filed 2006·Granted Jul 14, 2015·20 cites·53 claims
- 0985US12044981B2Method and apparatus for optimization of lithographic processASML NETHERLANDS BV·Filed 2021·Granted Jul 23, 2024·1 cites·20 claims
- 1085US2025264813A1Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2025·Application pending·0 cites
- 1181US11782349B2Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2023·Granted Oct 10, 2023·0 cites·20 claims
- 1280US11099486B2Generating predicted data for control or monitoring of a production processASML NETHERLANDS BV·Filed 2017·Granted Aug 24, 2021·3 cites·21 claims
- 1380US11054813B2Method and apparatus for controlling an industrial process using product groupingASML NETHERLANDS BV·Filed 2016·Granted Jul 6, 2021·2 cites·20 claims
- 1477US11592753B2Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2022·Granted Feb 28, 2023·0 cites·20 claims
- 1577US10877381B2Methods of determining corrections for a patterning processASML NETHERLANDS BV·Filed 2017·Granted Dec 29, 2020·1 cites·20 claims
- 1675US9971251B2Lithography system and a machine learning controller for such a lithography systemASML NETHERLANDS BV·Filed 2014·Granted May 15, 2018·2 cites·21 claims
- 1774US12204298B2Methods of modelling systems for performing predictive maintenance of systems, such as lithographic systemsASML NETHERLANDS BV·Filed 2021·Granted Jan 21, 2025·1 cites·20 claims
- 1874US11385550B2Methods and apparatus for obtaining diagnostic information relating to an industrial processASML NETHERLANDS BV·Filed 2020·Granted Jul 12, 2022·0 cites·20 claims
- 1974US11086229B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2018·Granted Aug 10, 2021·1 cites·24 claims
- 2074US9507279B2Method of operating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program productASML NETHERLANDS BV·Filed 2013·Granted Nov 29, 2016·2 cites·9 claims
- 2172US11327407B2Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatusASML NETHERLANDS BV·Filed 2020·Granted May 10, 2022·0 cites·20 claims
- 2270US11714357B2Method to predict yield of a device manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 1, 2023·0 cites·20 claims
- 2370US10539882B2Methods and apparatus for obtaining diagnostic information, methods and apparatus for controlling an industrial processASML NETHERLANDS BV·Filed 2017·Granted Jan 21, 2020·1 cites·20 claims
- 2469US11520238B2Optimizing an apparatus for multi-stage processing of product unitsASML NETHERLANDS BV·Filed 2021·Granted Dec 6, 2022·0 cites·20 claims
- 2563US12254392B2Apparatus and method for property joint interpolation and predictionASML NETHERLANDS BV·Filed 2019·Granted Mar 18, 2025·1 cites·20 claims
- 2659US9560991B2Efficient evaluation of hearing abilityDE VRIES AALBERT·Filed 2009·Granted Feb 7, 2017·3 cites·41 claims
- 2758US11099487B2Method and apparatus for optimization of lithographic processASML NETHERLANDS BV·Filed 2018·Granted Aug 24, 2021·0 cites·21 claims
- 2857US8792659B2Asymmetric adjustmentYPMA ALEXANDER·Filed 2008·Granted Jul 29, 2014·3 cites·30 claims
- 2956US11579534B2Extracting a feature from a data setASML NETHERLANDS BV·Filed 2020·Granted Feb 14, 2023·0 cites·20 claims
- 3056US11150562B2Optimizing an apparatus for multi-stage processing of product unitsASML NETHERLANDS BV·Filed 2018·Granted Oct 19, 2021·0 cites·20 claims
- 3155US9351087B2Learning control of hearing aid parameter settingsYPMA ALEXANDER·Filed 2007·Granted May 24, 2016·1 cites·20 claims
- 3255US2025029014A1Identifying deviating modules from a reference population for machine diagnosticsASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 3354US12045555B2Method to label substrates based on process parametersASML NETHERLANDS BV·Filed 2019·Granted Jul 23, 2024·0 cites·21 claims
- 3453US11740560B2Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing processASML NETHERLANDS BV·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 3552US2024273278A1Computer implemented method for diagnosing a system comprising a plurality of modulesASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
- 3651US11099485B2Maintaining a set of process fingerprintsASML NETHERLANDS BV·Filed 2018·Granted Aug 24, 2021·0 cites·20 claims
- 3751US9408002B2Learning control of hearing aid parameter settingsGN RESOUND AS·Filed 2013·Granted Aug 2, 2016·0 cites·27 claims
- 3849US11320743B2Method to label substrates based on process parametersASML NETHERLANDS BV·Filed 2019·Granted May 3, 2022·0 cites·20 claims
- 3942US2023252347A1Method and apparatus for concept drift mitigationASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 4041US2023076185A1Systems and methods for process metric aware process controlASML NETHERLANDS BV·Filed 2021·Application pending·0 cites
- 4140US2020050180A1Methods & apparatus for controlling an industrial processASML NETHERLANDS BV·Filed 2017·Application pending·0 cites
- 4238US2018239851A1Apparatus and method for inferring parameters of a model of a measurement structure for a patterning processASML NETHERLANDS BV·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →