Inventor · disambiguated record
Amitava Majumdar
Also filed as: MAJUMDAR AMITAVA
61 granted patents·12 pending applications·294 citations·filing 1997–2025
98Inventor score
Top patents by PatentIndex Score
73 records- 0197US9865567B1Heterogeneous integration of integrated circuit device and companion deviceXILINX INC·Filed 2017·Granted Jan 9, 2018·33 cites·16 claims
- 0297US9798352B1Circuits for and methods of implementing a design for testing and debugging with dual-edge clockingXILINX INC·Filed 2015·Granted Oct 24, 2017·20 cites·20 claims
- 0395US11429481B1Restoring memory data integrityXILINX INC·Filed 2021·Granted Aug 30, 2022·6 cites·20 claims
- 0493US11500017B1Testing memory elements using an internal testing interfaceXILINX INC·Filed 2021·Granted Nov 15, 2022·6 cites·16 claims
- 0593US11054461B1Test circuits for testing a die stackXILINX INC·Filed 2019·Granted Jul 6, 2021·12 cites·18 claims
- 0692US11639962B1Scalable scan architecture for multi-circuit block arraysXILINX INC·Filed 2021·Granted May 2, 2023·3 cites·19 claims
- 0791US11290095B1Programmable dynamic clock stretch for at-speed debugging of integrated circuitsXILINX INC·Filed 2021·Granted Mar 29, 2022·3 cites·20 claims
- 0890US11263377B1Circuit architecture for expanded design for testability functionalityXILINX INC·Filed 2021·Granted Mar 1, 2022·4 cites·20 claims
- 0990US9500700B1Circuits for and methods of testing the operation of an input/output portXILINX INC·Filed 2013·Granted Nov 22, 2016·10 cites·19 claims
- 1089US10110234B1Efficient system debug infrastructure for tiled architectureXILINX INC·Filed 2017·Granted Oct 23, 2018·10 cites·17 claims
- 1186US11585854B1Runtime measurement of process variations and supply voltage characteristicsXILINX INC·Filed 2018·Granted Feb 21, 2023·6 cites·19 claims
- 1284US9989572B1Method and apparatus for testing interposer dies prior to assemblyXILINX INC·Filed 2014·Granted Jun 5, 2018·5 cites·16 claims
- 1382US9600018B1Clock stoppage in integrated circuits with multiple asynchronous clock domainsXILINX INC·Filed 2014·Granted Mar 21, 2017·7 cites·16 claims
- 1482US6088823ACircuit for efficiently testing memory and shadow logic of a semiconductor integrated circuitSYNOPSYS INC·Filed 1998·Granted Jul 11, 2000·45 cites·24 claims
- 1580US11694747B2Self-selecting memory cells configured to store more than one bit per memory cellMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 4, 2023·1 cites·19 claims
- 1680US10756711B1Integrated circuit skew determinationXILINX INC·Filed 2019·Granted Aug 25, 2020·2 cites·20 claims
- 1780US8884804B1Time-to-digital conversionXILINX INC·Filed 2013·Granted Nov 11, 2014·9 cites·20 claims
- 1879US12462370B2System for predicting properties of structures, imager system, and related methodsMICRON TECHNOLOGY INC·Filed 2024·Granted Nov 4, 2025·0 cites·20 claims
- 1978US10672500B2Non-contact measurement of memory cell threshold voltageMICRON TECHNOLOGY INC·Filed 2019·Granted Jun 2, 2020·2 cites·20 claims
- 2078US9761533B2Interposer-less stack die interconnectXILINX INC·Filed 2015·Granted Sep 12, 2017·3 cites·20 claims
- 2178US9453870B1Testing for shorts between internal nodes of a power distribution gridXILINX INC·Filed 2014·Granted Sep 27, 2016·4 cites·19 claims
- 2278US6263461B1Circuit for efficiently testing memory and shadow logic of a semiconductor integrated circuitSYNOPSYS INC·Filed 2000·Granted Jul 17, 2001·19 cites·14 claims
- 2377US11302589B2Electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2019·Granted Apr 12, 2022·2 cites·12 claims
- 2477US8407544B2Method and apparatus for AC scan testing with distributed capture and shift logicMAJUMDAR AMITAVA·Filed 2010·Granted Mar 26, 2013·6 cites·29 claims
- 2576US10650891B2Non-contact electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2019·Granted May 12, 2020·3 cites·17 claims
- 2675US12511205B2Memory failure prediction and mitigationMICRON TECHNOLOGY INC·Filed 2024·Granted Dec 30, 2025·0 cites·18 claims
- 2775US7096393B2Built-in self-test (BIST) of memory interconnectSUN MICROSYSTEMS INC·Filed 2002·Granted Aug 22, 2006·25 cites·28 claims
- 2874US11222695B2Socket design for a memory deviceMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 11, 2022·1 cites·29 claims
- 2974US2024411466A1Memory device security and row hammer mitigationMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3073US11961556B2Socket design for a memory deviceMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 16, 2024·0 cites·17 claims
- 3173US2024355685A1Electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3272US2025053343A1Row hammer telemetryMICRON TECHNOLOGY INC·Filed 2024·Application pending·0 cites
- 3371US12451977B2Transceiver loopback testingXILINX INC·Filed 2023·Granted Oct 21, 2025·0 cites·20 claims
- 3471US12347512B2Error detection, correction, and media management on a memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Jul 1, 2025·0 cites·16 claims
- 3571US12067270B2Memory device security and row hammer mitigationMICRON TECHNOLOGY INC·Filed 2022·Granted Aug 20, 2024·0 cites·20 claims
- 3671US6813201B2Automatic generation and validation of memory test modelsSUN MICROSYSTEMS INC·Filed 2001·Granted Nov 2, 2004·18 cites·28 claims
- 3770US12354692B2Error detection, correction, and media management on a dram deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Jul 8, 2025·0 cites·16 claims
- 3870US12340861B2Selective per die DRAM PPR for memory deviceMICRON TECHNOLOGY INC·Filed 2023·Granted Jun 24, 2025·0 cites·19 claims
- 3970US12131071B2Row hammer telemetryMICRON TECHNOLOGY INC·Filed 2023·Granted Oct 29, 2024·0 cites·20 claims
- 4070US11996336B2Electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2022·Granted May 28, 2024·0 cites·18 claims
- 4169US12019516B2Instant write scheme with delayed parity/raidMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 25, 2024·0 cites·22 claims
- 4269US10403359B2Non-contact electron beam probing techniques and related structuresMICRON TECHNOLOGY INC·Filed 2018·Granted Sep 3, 2019·2 cites·5 claims
- 4367US11869178B2System for predicting properties of structures, imager system, and related methodsMICRON TECHNOLOGY INC·Filed 2020·Granted Jan 9, 2024·0 cites·18 claims
- 4467US11860228B2Integrated circuit chip testing interface with reduced signal wiresXILINX INC·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
- 4567US2025378864A1Finite time counting period counting of infinite data streamsMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 4666US12217824B2Finite time counting period counting of infinite data streamsMICRON TECHNOLOGY INC·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 4766US12013756B2Method and memory system for writing data to dram submodules based on the data traffic demandMICRON TECHNOLOGY INC·Filed 2022·Granted Jun 18, 2024·0 cites·16 claims
- 4866US11636911B2Leakage source detection for memory with varying conductive path lengthsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 25, 2023·0 cites·20 claims
- 4964US10621067B1Data unit breakpointing circuits and methodsXILINX INC·Filed 2018·Granted Apr 14, 2020·1 cites·20 claims
- 5063US10754759B1Breakpointing circuitry that evaluates breakpoint conditions while running clock to target circuitXILINX INC·Filed 2018·Granted Aug 25, 2020·1 cites·18 claims
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →