Inventor · disambiguated record
Amiko Nihei
Also filed as: NIHEI AMIKO
4 granted patents·1 pending application·49 citations·filing 2005–2007
72Inventor score
Top patents by PatentIndex Score
5 records- 0193US7098453B2Scanning probe microscopy system and method of measurement by the sameSII NANOTECHNOLOGY INC·Filed 2005·Granted Aug 29, 2006·39 cites·20 claims
- 0261US7456400B2Scanning probe microscope and scanning methodSEIKO INSTR INC·Filed 2005·Granted Nov 25, 2008·7 cites·18 claims
- 0359US7823470B2Cantilever and cantilever manufacturing methodSEIKO INSTR INC·Filed 2007·Granted Nov 2, 2010·3 cites·7 claims
- 0450US2007134787A1Living cell observing cellSHIRAKAWABE YOSHIHARU·Filed 2006·Application pending·0 cites
- 0545US8859279B2Cell detachment methodNIHEI AMIKO·Filed 2007·Granted Oct 14, 2014·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →