Inventor · disambiguated record
Amr M. E. Safwat
Also filed as: SAFWAT AMR M E
8 granted patents·229 citations·filing 2003–2007
90Inventor score
Top patents by PatentIndex Score
8 records- 0197US6815963B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2003·Granted Nov 9, 2004·80 cites·51 claims
- 0296US7161363B2Probe for testing a device under testCASCADE MICROTECH INC·Filed 2004·Granted Jan 9, 2007·64 cites·59 claims
- 0394US7304488B2Shielded probe for high-frequency testing of a device under testCASCADE MICROTECH INC·Filed 2006·Granted Dec 4, 2007·19 cites·1 claims
- 0490US7482823B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Jan 27, 2009·11 cites·33 claims
- 0588US7436194B2Shielded probe with low contact resistance for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Oct 14, 2008·10 cites·20 claims
- 0687US7518387B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Apr 14, 2009·9 cites·55 claims
- 0786US7489149B2Shielded probe for testing a device under testCASCADE MICROTECH INC·Filed 2007·Granted Feb 10, 2009·8 cites·17 claims
- 0871US7340703B2Test structures and method for interconnect impedance property extractionHEGAZY HAZEM MAHMOUD·Filed 2004·Granted Mar 4, 2008·28 cites·54 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →