Inventor · disambiguated record
Amir Sagiv
Also filed as: SAGIV AMIR · SAGIV AMIR MOSHE
9 granted patents·3 pending applications·12 citations·filing 2002–2023
80Inventor score
Top patents by PatentIndex Score
12 records- 0176US8984453B2Method and system for creation of binary spatial filtersMANGAN SHMUEL·Filed 2012·Granted Mar 17, 2015·3 cites·31 claims
- 0264US8213024B2Method and system for aerial imaging of a reticleMANGAN SHMUEL·Filed 2007·Granted Jul 3, 2012·2 cites·52 claims
- 0359US2025389530A1Optical critical dimensions (ocd) metrology for thick stacksNOVA LTD·Filed 2023·Application pending·0 cites
- 0457US8228497B2Method and system for evaluating an object that has a repetitive patternMANGAN SHMUEL·Filed 2008·Granted Jul 24, 2012·1 cites·9 claims
- 0557US7061266B2Methods and apparatus for improving impedance tolerance of on-die termination elementsINTEL CORP·Filed 2004·Granted Jun 13, 2006·6 cites·30 claims
- 0651US2024085805A1Time-domain optical metrology and inspection of semiconductor devicesNOVA LTD·Filed 2022·Application pending·0 cites
- 0749US10060736B1Near-field sensor height controlAPPLIED MATERIALS ISRAEL LTD·Filed 2016·Granted Aug 28, 2018·0 cites·15 claims
- 0849US9470637B2Method and system for use of binary spatial filtersAPPLIED MATERIALS ISRAEL LTD·Filed 2015·Granted Oct 18, 2016·0 cites·19 claims
- 0948US9395266B2On-tool wavefront aberrations measurement system and methodAPPLIED MATERIALS ISRAEL LTD·Filed 2014·Granted Jul 19, 2016·0 cites·15 claims
- 1037US8327298B2System and method for evaluating error sources associated with a maskFAIVISHEVSKY LEV·Filed 2010·Granted Dec 4, 2012·0 cites·24 claims
- 1135US2003164784A1System and method for noise approximationFiled 2002·Application pending·0 cites
- 1228US9244290B2Method and system for coherence reductionVANDER ROMAN·Filed 2011·Granted Jan 26, 2016·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →