Inventor · disambiguated record
Andrei Berar
Also filed as: BERAR ANDREI
3 granted patents·120 citations·filing 1997–1997
74Inventor score
Technology areasG01R
Files withCREDENCE SYSTEMS CORP3
Top patents by PatentIndex Score
3 records- 0184US6040700ASemiconductor tester system including test head supported by wafer prober frameCREDENCE SYSTEMS CORP·Filed 1997·Granted Mar 21, 2000·77 cites·14 claims
- 0269US6115645ASemiconductor tester with remote debugging for handlerCREDENCE SYSTEMS CORP·Filed 1997·Granted Sep 5, 2000·37 cites·7 claims
- 0331US6031387ASemiconductor test system with integrated test head manipulator and device handlerCREDENCE SYSTEMS CORP·Filed 1997·Granted Feb 29, 2000·6 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →