Inventor · disambiguated record
Anirudha Kulkarni
Also filed as: KULKARNI ANIRUDHA
3 granted patents·14 citations·filing 2010–2015
65Inventor score
Technology areasG01R
Top patents by PatentIndex Score
3 records- 0189US9632140B2Circuit for testing integrated circuitsST MICROELECTRONICS INT NV·Filed 2014·Granted Apr 25, 2017·9 cites·10 claims
- 0276US8918689B2Circuit for testing integrated circuitsKULKARNI ANIRUDHA·Filed 2010·Granted Dec 23, 2014·5 cites·6 claims
- 0355US9689924B2Circuit for testing integrated circuitsST MICROELECTRONICS INT NV·Filed 2015·Granted Jun 27, 2017·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →