Inventor · disambiguated record
Anthony Le
Also filed as: LE ANTHONY · LE ANTHONY Y
24 granted patents·1 pending application·296 citations·filing 1999–2022
96Inventor score
Top patents by PatentIndex Score
25 records- 0190US6377065B1Glitch detection for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Apr 23, 2002·50 cites·12 claims
- 0281US6804620B1Calibration method for system performance validation of automatic test equipmentADVANTEST CORP·Filed 2003·Granted Oct 12, 2004·31 cites·36 claims
- 0381US6747447B2Locking apparatus and loadboard assemblyADVANTEST CORP·Filed 2002·Granted Jun 8, 2004·30 cites·13 claims
- 0479US6404218B1Multiple end of test signal for event based test systemADVANTEST CORP·Filed 2000·Granted Jun 11, 2002·24 cites·14 claims
- 0576US7366939B2Providing precise timing control between multiple standardized test instrumentation chassisADVANTEST CORP·Filed 2005·Granted Apr 29, 2008·9 cites·22 claims
- 0675US6578169B1Data failure memory compaction for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Jun 10, 2003·19 cites·9 claims
- 0772US7089135B2Event based IC test systemADVANTEST CORP·Filed 2002·Granted Aug 8, 2006·15 cites·17 claims
- 0869US6934896B2Time shift circuit for functional and AC parametric testADVANTEST CORP·Filed 2001·Granted Aug 23, 2005·18 cites·7 claims
- 0969US6710590B1Test head Hifix for semiconductor device testing apparatusADVANTEST CORP·Filed 2002·Granted Mar 23, 2004·17 cites·16 claims
- 1067US7984284B2SPI auto-boot modeSPANSION LLC·Filed 2007·Granted Jul 19, 2011·4 cites·18 claims
- 1167US7979625B2SPI bank addressing scheme for memory densities above 128MbSPANSION LLC·Filed 2007·Granted Jul 12, 2011·6 cites·20 claims
- 1265US7437589B2Providing precise timing control within a standardized test instrumentation chassisADVANTEST CORP·Filed 2005·Granted Oct 14, 2008·5 cites·21 claims
- 1365US6226765B1Event based test system data memory compressionADVANTEST CORP·Filed 1999·Granted May 1, 2001·27 cites·8 claims
- 1464US2022153708A1Two piece sensor assembly and method of useMEDIBEACON INC·Filed 2022·Application pending·0 cites
- 1562US11261165B2Two piece sensor assembly and method of useMEDIBEACON INC·Filed 2019·Granted Mar 1, 2022·0 cites·20 claims
- 1662US9227125B2Basketball return apparatusLE ANTHONY Y·Filed 2014·Granted Jan 5, 2016·4 cites·6 claims
- 1761US7010452B2Event pipeline and summing method and apparatus for event based test systemADVANTEST CORP·Filed 2003·Granted Mar 7, 2006·10 cites·19 claims
- 1860US6668331B1Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memoryADVANTEST CORP·Filed 2000·Granted Dec 23, 2003·11 cites·8 claims
- 1957US6594609B1Scan vector support for event based test systemADVANTEST CORP·Filed 2000·Granted Jul 15, 2003·6 cites·10 claims
- 2056US7171602B2Event processing apparatus and method for high speed event based test systemADVANTEST CORP·Filed 2002·Granted Jan 30, 2007·8 cites·29 claims
- 2141US6771062B1Apparatus for supporting and manipulating a testhead in an automatic test equipment systemADVANTEST CORP·Filed 2003·Granted Aug 3, 2004·2 cites·29 claims
- 2237US7437588B2Circuit card synchronization within a standardized test instrumentation chassisADVANTEST CORP·Filed 2005·Granted Oct 14, 2008·0 cites·55 claims
- 2336US9223726B2Apparatus and method for programmable read preamble with training patternZITLAW CLIFFORD ALAN·Filed 2010·Granted Dec 29, 2015·0 cites·18 claims
- 2436US8417874B2High speed memory having a programmable read preambleZITLAW CLIFFORD ALAN·Filed 2010·Granted Apr 9, 2013·0 cites·20 claims
- 2528US9697872B2High speed serial peripheral interface memory subsystemWIDMER KEVIN·Filed 2011·Granted Jul 4, 2017·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →