Inventor · disambiguated record
Antonio Mani
Also filed as: MANI ANTONIO
4 granted patents·13 citations·filing 2017–2021
67Inventor score
Technology areasH10P
Files withKLA TENCOR CORP4
Top patents by PatentIndex Score
4 records- 0189US10943838B2Measurement of overlay error using device inspection systemKLA TENCOR CORP·Filed 2018·Granted Mar 9, 2021·6 cites·20 claims
- 0286US10699926B2Identifying nuisances and defects of interest in defects detected on a waferKLA TENCOR CORP·Filed 2018·Granted Jun 30, 2020·7 cites·26 claims
- 0364US11784097B2Measurement of overlay error using device inspection systemKLA TENCOR CORP·Filed 2021·Granted Oct 10, 2023·0 cites·12 claims
- 0441US10598617B2Metrology guided inspection sample shaping of optical inspection resultsKLA TENCOR CORP·Filed 2017·Granted Mar 24, 2020·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →