Inventor · disambiguated record
Ankush Oberai
Also filed as: OBERAI ANKUSH · OBERAI ANKUSH B · OBERAI ANKUSH BHARATI
13 granted patents·38 citations·filing 2011–2021
87Inventor score
Top patents by PatentIndex Score
13 records- 0188US9454635B2Virtual layer generation during failure analysisSYNOPSYS INC·Filed 2015·Granted Sep 27, 2016·8 cites·24 claims
- 0287US9430606B2Failure analysis and inline defect characterizationSYNOPSYS INC·Filed 2014·Granted Aug 30, 2016·12 cites·27 claims
- 0383US9147027B2Chip cross-section identification and rendering during failure analysisSYNOPSYS INC·Filed 2014·Granted Sep 29, 2015·6 cites·31 claims
- 0474US8775979B2Failure analysis using design rulesOBERAI ANKUSH·Filed 2011·Granted Jul 8, 2014·5 cites·22 claims
- 0569US8826209B2Automated inline defect characterizationKRAMER JAMES ROBERT·Filed 2012·Granted Sep 2, 2014·6 cites·41 claims
- 0655US8255865B2Signal tracing through boards and chipsOBERAI ANKUSH·Filed 2011·Granted Aug 28, 2012·1 cites·38 claims
- 0753US10295988B2Electronic virtual layerSYNOPSYS INC·Filed 2017·Granted May 21, 2019·0 cites·10 claims
- 0853US9471745B2Chip cross-section identification and rendering analysisSYNOPSYS INC·Filed 2015·Granted Oct 18, 2016·0 cites·27 claims
- 0952US10990077B2Electronic virtual layerSYNOPSYS INC·Filed 2019·Granted Apr 27, 2021·0 cites·6 claims
- 1048US11861286B2Segregating defects based on computer-aided design (CAD) identifiers associated with the defectsSYNOPSYS INC·Filed 2021·Granted Jan 2, 2024·0 cites·18 claims
- 1148US11561256B2Correlation between emission spots utilizing CAD data in combination with emission microscope imagesSYNOPSYS INC·Filed 2020·Granted Jan 24, 2023·0 cites·20 claims
- 1247US10650509B2Video overlaySYNOPSYS INC·Filed 2017·Granted May 12, 2020·0 cites·20 claims
- 1346US11763059B2Net-based wafer inspectionSYNOPSYS INC·Filed 2020·Granted Sep 19, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →