Inventor · disambiguated record
Andre Poock
Also filed as: POOCK ANDRE
3 granted patents·1 pending application·3 citations·filing 2008–2011
54Inventor score
Top patents by PatentIndex Score
4 records- 0166US7887978B2Method of detecting repeating defects in lithography masks on the basis of test substrates exposed under varying conditionsGLOBALFOUNDRIES INC·Filed 2008·Granted Feb 15, 2011·2 cites·15 claims
- 0246US8660681B2Method and system for excursion monitoring in optical lithography processes in micro device fabricationPOOCK ANDRE·Filed 2011·Granted Feb 25, 2014·1 cites·17 claims
- 0335US2010112468A1Self-correcting substrate support system for focus control in exposure systemsPOOCK ANDRE·Filed 2009·Application pending·0 cites
- 0429US7977225B2Reducing implant degradation in tilted implantations by shifting implantation masksGLOBALFOUNDRIES INC·Filed 2009·Granted Jul 12, 2011·0 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →