Inventor · disambiguated record
Andre Scherz
Also filed as: SCHERZ ANDRE
4 granted patents·36 citations·filing 2005–2016
73Inventor score
Top patents by PatentIndex Score
4 records- 0191US9381524B2System and method for automated sample preparationBECTON DICKINSON CO·Filed 2012·Granted Jul 5, 2016·14 cites·22 claims
- 0287US7285963B2Method and system for measurement of dielectric constant of thin films using a near field microwave probeSOLID STATE MEASUREMENTS INC·Filed 2005·Granted Oct 23, 2007·19 cites·20 claims
- 0374US9931644B2System and method for automated sample preparationBECTON DICKINSON CO·Filed 2016·Granted Apr 3, 2018·1 cites·19 claims
- 0462US7362108B2Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probeSOLID STATE MEASUREMENTS INC·Filed 2005·Granted Apr 22, 2008·2 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →