Inventor · disambiguated record
Andrew R. Schwartz
Also filed as: SCHWARTZ ANDREW R
7 granted patents·97 citations·filing 2002–2005
85Inventor score
Top patents by PatentIndex Score
7 records- 0187US7285963B2Method and system for measurement of dielectric constant of thin films using a near field microwave probeSOLID STATE MEASUREMENTS INC·Filed 2005·Granted Oct 23, 2007·19 cites·20 claims
- 0279US6680617B2Apertured probes for localized measurements of a material's complex permittivity and fabrication methodNEOCERA INC·Filed 2002·Granted Jan 20, 2004·27 cites·19 claims
- 0378US7102363B2Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuitsNEOCERA INC·Filed 2005·Granted Sep 5, 2006·7 cites·20 claims
- 0475US6856140B2System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probesNEOCERA INC·Filed 2003·Granted Feb 15, 2005·25 cites·21 claims
- 0568US6959481B2Apertured probes for localized measurements of a material's complex permittivity and fabrication methodNEOCERA INC·Filed 2003·Granted Nov 1, 2005·12 cites·9 claims
- 0662US7362108B2Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probeSOLID STATE MEASUREMENTS INC·Filed 2005·Granted Apr 22, 2008·2 cites·20 claims
- 0750US6943562B2Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuitsNEOCERA INC·Filed 2003·Granted Sep 13, 2005·5 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →