Inventor · disambiguated record
Anubhav Sinha
Also filed as: SINHA ANUBHAV
10 granted patents·2 pending applications·53 citations·filing 2012–2024
83Inventor score
Files withSYNOPSYS INC6MASSACHUSETTS INST TECHNOLOGY2NVIDIA CORP2INTEL CORP1TATA CONSULTANCY SERVICES LTD1
Top patents by PatentIndex Score
12 records- 0195US10995361B2Multiplexed signal amplified FISH via splinted ligation amplification and sequencingMASSACHUSETTS INST TECHNOLOGY·Filed 2018·Granted May 4, 2021·44 cites·15 claims
- 0286US11662383B2High-speed functional protocol based test and debugSYNOPSYS INC·Filed 2021·Granted May 30, 2023·2 cites·14 claims
- 0381US9222981B2Global low power capture scheme for coresNVIDIA CORP·Filed 2012·Granted Dec 29, 2015·5 cites·20 claims
- 0472US11626178B2Packetized power-on-self-test controller for built-in self-testSYNOPSYS INC·Filed 2021·Granted Apr 11, 2023·1 cites·19 claims
- 0565US12015411B2Testable time-to-digital converterSYNOPSYS INC·Filed 2022·Granted Jun 18, 2024·0 cites·20 claims
- 0665US2021395796A1Multiplexed Signal Amplified FISH Via Splinted Ligation Amplification and SequencingMASSACHUSETTS INST TECHNOLOGY·Filed 2021·Application pending·0 cites
- 0762US12140632B2Device under test synchronization with automated test equipment check cycleSYNOPSYS INC·Filed 2021·Granted Nov 12, 2024·0 cites·19 claims
- 0862US11257560B2Test architecture for die to die interconnect for three dimensional integrated circuitsINTEL CORP·Filed 2017·Granted Feb 22, 2022·1 cites·9 claims
- 0957US11921160B2Using scan chains to read out data from integrated sensors during scan testsSYNOPSYS INC·Filed 2022·Granted Mar 5, 2024·0 cites·18 claims
- 1055US10473720B2Dynamic independent test partition clockNVIDIA CORP·Filed 2016·Granted Nov 12, 2019·0 cites·12 claims
- 1154US2025201010A1Perplexity and log-likelihood based approach for text classification using causal language modelsTATA CONSULTANCY SERVICES LTD·Filed 2024·Application pending·0 cites
- 1250US11860751B1Deterministic data latency in serializer/deserializer-based design for test systemsSYNOPSYS INC·Filed 2022·Granted Jan 2, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →