Inventor · disambiguated record
Ariel Broitman
Also filed as: BROITMAN ARIEL
4 granted patents·2 pending applications·4 citations·filing 2019–2025
65Inventor score
Top patents by PatentIndex Score
6 records- 0193US11763181B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2021·Granted Sep 19, 2023·3 cites·20 claims
- 0280US12236364B2Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2023·Granted Feb 25, 2025·0 cites·18 claims
- 0376US2025027767A1Detecting outliers and anomalies for ocd metrology machine learningNOVA LTD·Filed 2024·Application pending·0 cites
- 0475US11093840B2Metrology and process control for semiconductor manufacturingNOVA MEASURING INSTR LTD·Filed 2019·Granted Aug 17, 2021·1 cites·16 claims
- 0575US2025181941A1Metrology and process control for semiconductor manufacturingNOVA LTD·Filed 2025·Application pending·0 cites
- 0662US12038271B2Detecting outliers and anomalies for OCD metrology machine learningNOVA LTD·Filed 2021·Granted Jul 16, 2024·0 cites·17 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →