Inventor · disambiguated record
Arvind Chokhani
Also filed as: CHOKHANI ARVIND
7 granted patents·15 citations·filing 2021–2022
78Inventor score
Files withCADENCE DESIGN SYSTEMS INC7
Top patents by PatentIndex Score
7 records- 0190US11740284B1Diagnosing multicycle faults and/or defects with single cycle ATPG test patternsCADENCE DESIGN SYSTEMS INC·Filed 2021·Granted Aug 29, 2023·3 cites·20 claims
- 0289US11892501B1Diagnosing multicycle transition faults and/or defects with AT-speed ATPG test patternsCADENCE DESIGN SYSTEMS INC·Filed 2022·Granted Feb 6, 2024·3 cites·20 claims
- 0389US11429776B1Fault rules files for testing an IC chipCADENCE DESIGN SYSTEMS INC·Filed 2021·Granted Aug 30, 2022·3 cites·17 claims
- 0488US11435401B1Timed transition cell-aware ATPG using fault rule files and SDF for testing an IC chipCADENCE DESIGN SYSTEMS INC·Filed 2021·Granted Sep 6, 2022·2 cites·20 claims
- 0587US11579194B1Utilizing single cycle ATPG test patterns to detect multicycle cell-aware defectsCADENCE DESIGN SYSTEMS INC·Filed 2021·Granted Feb 14, 2023·2 cites·20 claims
- 0682US11461520B1SDD ATPG using fault rules files, SDF and node slack for testing an IC chipCADENCE DESIGN SYSTEMS INC·Filed 2021·Granted Oct 4, 2022·2 cites·15 claims
- 0752US11893336B1Utilizing transition ATPG test patterns to detect multicycle faults and/or defects in an IC chipCADENCE DESIGN SYSTEMS INC·Filed 2021·Granted Feb 6, 2024·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →