Inventor · disambiguated record
Aritomo Kikuchi
Also filed as: KIKUCHI ARITOMO
13 granted patents·12 pending applications·25 citations·filing 2005–2025
85Inventor score
Top patents by PatentIndex Score
25 records- 0183US8941729B2Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing methodKIKUCHI ARITOMO·Filed 2011·Granted Jan 27, 2015·7 cites·3 claims
- 0279US9453874B2Actuator, handler apparatus and test apparatusADVANTEST CORP·Filed 2014·Granted Sep 27, 2016·4 cites·13 claims
- 0376US11496227B2Electronic component handling apparatus, electronic component testing apparatus, and socketADVANTEST CORP·Filed 2020·Granted Nov 8, 2022·1 cites·12 claims
- 0476US7471819B2Position detecting apparatus, a position detecting method and an electronic component carrying apparatusADVANTEST CORP·Filed 2005·Granted Dec 30, 2008·9 cites·16 claims
- 0575US2025172612A1Test arrangement for over-the-air testing an angled device under test in a device-under-test socketADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0675US2025172600A1Test arrangement for over-the-air testing an angled device under test that is tilted relative to a surface of a carrier structureADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0775US2025172613A1Test arrangement for over-the-air testing an angled device under test using a carrier structure with an openingADVANTEST CORP·Filed 2025·Application pending·0 cites
- 0871US12436185B2Temperature adjusting device, electronic component handling apparatus, and electronic component test apparatusADVANTEST CORP·Filed 2023·Granted Oct 7, 2025·0 cites·15 claims
- 0969US12422472B2Temperature control device, electronic component handling apparatus, electronic component test apparatus, and DUT temperature control methodADVANTEST CORP·Filed 2022·Granted Sep 23, 2025·0 cites·16 claims
- 1066US8294759B2Calibration method of electronic device test apparatusKIKUCHI ARITOMO·Filed 2006·Granted Oct 23, 2012·4 cites·18 claims
- 1162US11353502B2Electronic component handling apparatus and electronic component testing apparatusADVANTEST CORP·Filed 2021·Granted Jun 7, 2022·0 cites·10 claims
- 1261US2025172610A1Device handling apparatus and device testing apparatusADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1361US2025076367A1Semiconductor wafer handling apparatus and semiconductor wafer testing systemADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1461US2025216443A1Semiconductor device handling apparatus and semiconductor device testing apparatusADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1561US2025076366A1Semiconductor wafer handling apparatus and semiconductor wafer testing systemADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1660US2025076374A1Semiconductor device handling apparatus and semiconductor device testing apparatusADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1760US2024288491A1Temperature control apparatus, test apparatus, temperature control method, and non-transitory computer readable mediumADVANTEST CORP·Filed 2024·Application pending·0 cites
- 1856US11287468B2Electronic component handling apparatus, electronic component testing apparatus, and socketADVANTEST CORP·Filed 2020·Granted Mar 29, 2022·0 cites·16 claims
- 1956US2024183897A1Wafer scale active thermal interposer with thermal isolation structuresADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 2056US2024183898A1Active thermal interposer device with thermal isolation structuresADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 2150US9784789B2Handler apparatus that conveys a device under test to a test socket and test apparatus including the handler apparatusADVANTEST CORP·Filed 2014·Granted Oct 10, 2017·0 cites·16 claims
- 2249US10823788B2Magnetic sensor testing deviceADVANTEST CORP·Filed 2018·Granted Nov 3, 2020·0 cites·9 claims
- 2344US9778283B2Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing methodADVANTEST CORP·Filed 2013·Granted Oct 3, 2017·0 cites·14 claims
- 2439US2010310151A1Electronic device handling apparatus and electronic device position detection methodADVANTEST CORP·Filed 2008·Application pending·0 cites
- 2535US10297043B2Detector for detecting position of IC device and method for the sameADVANTEST CORP·Filed 2017·Granted May 21, 2019·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →