Inventor · disambiguated record
Atsushi Igarashi
Also filed as: IGARASHI ATSUSHI
29 granted patents·4 pending applications·87 citations·filing 2005–2023
95Inventor score
Top patents by PatentIndex Score
33 records- 0186US10999479B1Communication device, communication system, communication method, and recording mediumTOSHIBA KK·Filed 2020·Granted May 4, 2021·2 cites·13 claims
- 0285US8451571B2Overheat protection circuit and power supply integrated circuitIMURA TAKASHI·Filed 2010·Granted May 28, 2013·8 cites·5 claims
- 0384US7880528B2Temperature detection circuitSEIKO INSTR INC·Filed 2009·Granted Feb 1, 2011·16 cites·14 claims
- 0483US11340318B2Magnetic sensor and magnetic detection methodABLIC INC·Filed 2021·Granted May 24, 2022·1 cites·20 claims
- 0583US8604821B2Power supply voltage monitoring circuit and electronic circuit including the power supply voltage monitoring circuitSUGIURA MASAKAZU·Filed 2010·Granted Dec 10, 2013·7 cites·8 claims
- 0680US8476967B2Constant current circuit and reference voltage circuitKOBAYASHI YUJI·Filed 2011·Granted Jul 2, 2013·5 cites·6 claims
- 0779US10288694B2Secondary battery monitoring device and method for diagnosing failureSII SEMICONDUCTOR CORP·Filed 2017·Granted May 14, 2019·2 cites·6 claims
- 0877US8895140B2Vinylidene fluoride resin filmYOSHIMURA HIDETOSHI·Filed 2010·Granted Nov 25, 2014·6 cites·14 claims
- 0975US7977999B2Temperature detection circuitSEIKO INSTR INC·Filed 2009·Granted Jul 12, 2011·10 cites·4 claims
- 1071US8183907B2Detection circuit and sensor deviceSUGIURA MASAKAZU·Filed 2010·Granted May 22, 2012·2 cites·14 claims
- 1171US8063675B2Delay circuit including first and second internal delay circuits and a selection switchIGARASHI ATSUSHI·Filed 2010·Granted Nov 22, 2011·4 cites·8 claims
- 1266US7997794B2Temperature sensor circuitSEIKO INSTR INC·Filed 2007·Granted Aug 16, 2011·6 cites·9 claims
- 1365US12397343B2Mold cooling device, cast manufacturing system, and cast manufacturing methodTPR CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·6 claims
- 1463US9030249B2Level shift circuitSEIKO INSTR INC·Filed 2014·Granted May 12, 2015·2 cites·6 claims
- 1563US8264277B2Differential amplifier circuitIGARASHI ATSUSHI·Filed 2011·Granted Sep 11, 2012·3 cites·4 claims
- 1660US7795950B2Temperature detection circuitSEIKO INSTR INC·Filed 2008·Granted Sep 14, 2010·4 cites·1 claims
- 1760US7479826B2Chopper amplifier circuit and semiconductor deviceSEIKO INSTR INC·Filed 2006·Granted Jan 20, 2009·4 cites·7 claims
- 1859US9733284B2Current detection circuitSII SEMICONDUCTOR CORP·Filed 2016·Granted Aug 15, 2017·1 cites·3 claims
- 1959US9118326B2Output circuit, temperature switch IC, and battery packMITANI MASAHIRO·Filed 2012·Granted Aug 25, 2015·2 cites·5 claims
- 2050US8547163B2Temperature sensor deviceSUGIURA MASAKAZU·Filed 2012·Granted Oct 1, 2013·0 cites·4 claims
- 2148US7508258B2Amplifier circuitSEIKO INSTR INC·Filed 2007·Granted Mar 24, 2009·2 cites·4 claims
- 2247US9772365B2Detection circuitSEIKO INSTR INC·Filed 2016·Granted Sep 26, 2017·0 cites·5 claims
- 2346US9059699B2Power supply switching circuitSEIKO INSTR INC·Filed 2013·Granted Jun 16, 2015·0 cites·4 claims
- 2446US8531234B2Temperature detection deviceSUGIURA MASAKAZU·Filed 2011·Granted Sep 10, 2013·0 cites·7 claims
- 2544US9983067B2Overheat detection circuit and semiconductor deviceSEIKO INSTR INC·Filed 2015·Granted May 29, 2018·0 cites·4 claims
- 2643US10503197B2Current generation circuitABLIC INC·Filed 2018·Granted Dec 10, 2019·0 cites·4 claims
- 2742US8449179B2Temperature detection systemIGARASHI ATSUSHI·Filed 2010·Granted May 28, 2013·0 cites·2 claims
- 2839US10564205B2Voltage abnormality detection circuit and semiconductor deviceSII SEMICONDUCTOR CORP·Filed 2017·Granted Feb 18, 2020·0 cites·4 claims
- 2939US9454174B2Power supply voltage monitoring circuit, and electronic circuit including the power supply voltage monitoring circuitSEIKO INSTR INC·Filed 2015·Granted Sep 27, 2016·0 cites·5 claims
- 3039US2012131402A1Test mode setting circuitSUGIURA MASAKAZU·Filed 2011·Application pending·0 cites
- 3135US2006001110A1Lateral trench MOSFETIGARASHI ATSUSHI·Filed 2005·Application pending·0 cites
- 3233US2016064916A1Detection circuit and semiconductor deviceSEIKO INSTR INC·Filed 2015·Application pending·0 cites
- 3327US2010176874A1Voltage detection circuitSUGIURA MASAKAZU·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →