Inventor · disambiguated record
Axel Nackaerts
Also filed as: NACKAERTS AXEL
21 granted patents·5 pending applications·49 citations·filing 2006–2019
92Inventor score
Top patents by PatentIndex Score
26 records- 0189US8779781B2Capacitive sensor, integrated circuit, electronic device and methodNGUYEN VIET HOANG·Filed 2012·Granted Jul 15, 2014·10 cites·13 claims
- 0285US9099486B2Integrated circuit with ion sensitive sensor and manufacturing methodNXP BV·Filed 2013·Granted Aug 4, 2015·7 cites·12 claims
- 0382US10498397B1Wireless deviceNXP BV·Filed 2019·Granted Dec 3, 2019·3 cites·22 claims
- 0481US9606115B2Analyte detection methods and devicesNXP BV·Filed 2015·Granted Mar 28, 2017·2 cites·15 claims
- 0581US9210761B2Lighting systemNACKAERTS AXEL·Filed 2012·Granted Dec 8, 2015·6 cites·20 claims
- 0681US8957687B2SensorNACKAERTS AXEL·Filed 2012·Granted Feb 17, 2015·4 cites·13 claims
- 0780US10060817B2Integrated circuit with a pressure sensorAMS INT AG·Filed 2016·Granted Aug 28, 2018·2 cites·7 claims
- 0877US10384001B2Fluid flow deviceNXP BV·Filed 2017·Granted Aug 20, 2019·3 cites·18 claims
- 0976US10747851B2Segmented platform for itemsNXP BV·Filed 2017·Granted Aug 18, 2020·1 cites·18 claims
- 1071US7704850B2Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2006·Granted Apr 27, 2010·3 cites·18 claims
- 1169US11293963B2Device for electromagnetic structural characterizationNXP BV·Filed 2017·Granted Apr 5, 2022·1 cites·17 claims
- 1262US8136078B2OptimizationNACKAERTS AXEL·Filed 2008·Granted Mar 13, 2012·3 cites·16 claims
- 1361US7786477B2Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing methodASML NETHERLANDS BV·Filed 2007·Granted Aug 31, 2010·1 cites·4 claims
- 1459US8021989B2Method for high topography patterningIMEC·Filed 2006·Granted Sep 20, 2011·3 cites·12 claims
- 1556US10712303B2Liquid exposure sensing device and controllerNXP BV·Filed 2018·Granted Jul 14, 2020·0 cites·22 claims
- 1655US9481570B2Method of manufacturing an integrated circuit comprising a pressure sensorAMS INT AG·Filed 2016·Granted Nov 1, 2016·0 cites·7 claims
- 1754US9269832B2Integrated circuit with pressure sensor having a pair of electrodesAMS INTERNAT AG·Filed 2013·Granted Feb 23, 2016·0 cites·17 claims
- 1848US10417147B2Buffer device, an electronic system, and a method for operating a buffer deviceNXP BV·Filed 2016·Granted Sep 17, 2019·0 cites·18 claims
- 1948US9739774B2Substance detection deviceNXP BV·Filed 2015·Granted Aug 22, 2017·0 cites·16 claims
- 2046US2007172770A1Methods for manufacturing dense integrated circuitsWITTERS LIESBETH·Filed 2006·Application pending·0 cites
- 2144US8872520B2Sensor and measurement methodNACKAERTS AXEL·Filed 2011·Granted Oct 28, 2014·0 cites·20 claims
- 2244US2011084313A1Methods for Manufacturing Dense Integrated CircuitsIMEC·Filed 2010·Application pending·0 cites
- 2341US2020382153A1Communications deviceNXP BV·Filed 2019·Application pending·0 cites
- 2437US2013070807A1Temperature Sensor, Electronic Device and Temperature Measurement MethodPONOMAREV YOURI VICTOROVITCH·Filed 2012·Application pending·0 cites
- 2531US7737008B2Method for making quantum dotsIMEC·Filed 2008·Granted Jun 15, 2010·0 cites·13 claims
- 2629US2016228049A1Wound monitoringNXP BV·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →