Inventor · disambiguated record
Bart Buijsse
Also filed as: BUIJSSE BART
36 granted patents·4 pending applications·248 citations·filing 2000–2024
97Inventor score
Top patents by PatentIndex Score
40 records- 0196US11183364B1Dual beam microscope system for imaging during sample processingFEI CO·Filed 2020·Granted Nov 23, 2021·7 cites·19 claims
- 0295US7317515B2Method of localizing fluorescent markersFEI CO·Filed 2005·Granted Jan 8, 2008·29 cites·20 claims
- 0394US7064325B2Apparatus with permanent magnetic lensesFEI CO·Filed 2005·Granted Jun 20, 2006·20 cites·24 claims
- 0493US9312098B2Method of examining a sample in a charged-particle microscopeFEI CO·Filed 2015·Granted Apr 12, 2016·16 cites·20 claims
- 0593US8772716B2Phase plate for a TEMFEI CO·Filed 2013·Granted Jul 8, 2014·12 cites·11 claims
- 0692US7906762B2Compact scanning electron microscopeFEI CO·Filed 2007·Granted Mar 15, 2011·25 cites·16 claims
- 0791US11101101B2Laser-based phase plate image contrast manipulationFEI CO·Filed 2020·Granted Aug 24, 2021·3 cites·25 claims
- 0891US8309921B2Compact scanning electron microscopeBIERHOFF MARTINUS PETRUS MARIA·Filed 2011·Granted Nov 13, 2012·17 cites·7 claims
- 0988US9129774B2Method of using a phase plate in a transmission electron microscopeFEI CO·Filed 2014·Granted Sep 8, 2015·10 cites·20 claims
- 1088US8093558B2Environmental cell for a particle-optical apparatusBUIJSSE BART·Filed 2009·Granted Jan 10, 2012·10 cites·31 claims
- 1188US7456413B2Apparatus for evacuating a sampleFEI CO·Filed 2005·Granted Nov 25, 2008·17 cites·22 claims
- 1288US7067820B2Particle-optical apparatus with a permanent-magnetic lens and an electrostatic lensFEI CO·Filed 2004·Granted Jun 27, 2006·28 cites·23 claims
- 1387US7285785B2Apparatus with permanent magnetic lensesFEI CO·Filed 2006·Granted Oct 23, 2007·8 cites·24 claims
- 1485US7301157B2Cluster tool for microscopic processing of samplesFEI CO·Filed 2005·Granted Nov 27, 2007·10 cites·18 claims
- 1584US8633456B2Method for centering an optical element in a TEM comprising a contrast enhancing elementBUIJSSE BART·Filed 2012·Granted Jan 21, 2014·6 cites·20 claims
- 1683US10545100B2X-ray imaging techniqueFEI CO·Filed 2016·Granted Jan 28, 2020·3 cites·19 claims
- 1782US10651008B2Diffraction pattern detection in a transmission charged particle microscopeFEI CO·Filed 2018·Granted May 12, 2020·2 cites·20 claims
- 1881US8637821B2Blocking member for use in the diffraction plane of a TEMBUIJSSE BART·Filed 2011·Granted Jan 28, 2014·5 cites·21 claims
- 1980US12009176B2Method and system for generating a diffraction imageFEI CO·Filed 2023·Granted Jun 11, 2024·0 cites·9 claims
- 2080US9865427B2User interface for an electron microscopeFEI CO·Filed 2015·Granted Jan 9, 2018·2 cites·16 claims
- 2177US8658974B2Environmental cell for a particle-optical apparatusBUIJSSE BART·Filed 2011·Granted Feb 25, 2014·3 cites·27 claims
- 2276US9293297B2Correlative optical and charged particle microscopeFEI CO·Filed 2015·Granted Mar 22, 2016·2 cites·20 claims
- 2375US8835846B2Imaging a sample in a TEM equipped with a phase plateFEI CO·Filed 2013·Granted Sep 16, 2014·3 cites·20 claims
- 2474US10935506B2Method and system for determining molecular structureFEI CO·Filed 2019·Granted Mar 2, 2021·1 cites·18 claims
- 2574US9006652B2Phase shift method for a TEMFEI CO·Filed 2014·Granted Apr 14, 2015·2 cites·14 claims
- 2673US11694874B2Method and system for generating a diffraction imageFEI CO·Filed 2021·Granted Jul 4, 2023·0 cites·15 claims
- 2771US9908778B2Method of producing a freestanding thin film of nano-crystalline graphiteFEI CO·Filed 2014·Granted Mar 6, 2018·1 cites·21 claims
- 2870US9025018B2User interface for an electron microscopeBIERHOFF MARTINUS PETRUS MARIA·Filed 2007·Granted May 5, 2015·2 cites·21 claims
- 2968US11004655B2Diffraction pattern detection in a transmission charged particle microscopeFEI CO·Filed 2020·Granted May 11, 2021·0 cites·20 claims
- 3066US12306119B2Methods and systems for determining the absolute structure of crystalFEI CO·Filed 2022·Granted May 20, 2025·0 cites·20 claims
- 3166US2025182997A1Transmission electron microscope with variable effective focal lengthFEI CO·Filed 2024·Application pending·0 cites
- 3263US11456149B2Methods and systems for acquiring 3D diffraction dataFEI CO·Filed 2020·Granted Sep 27, 2022·0 cites·19 claims
- 3359US11988618B2Method and system to determine crystal structureFEI CO·Filed 2021·Granted May 21, 2024·0 cites·20 claims
- 3458US2024203685A1Pole piece incorporating optical cavity for improved phase-contrast in electron microscope imagingFEI CO·Filed 2022·Application pending·0 cites
- 3557US11815476B2Methods and systems for acquiring three-dimensional electron diffraction dataFEI CO·Filed 2021·Granted Nov 14, 2023·0 cites·21 claims
- 3655US7173999B2X-ray microscope having an X-ray source for soft X-rayKONINKL PHILIPS ELECTRONICS NV·Filed 2000·Granted Feb 6, 2007·4 cites·7 claims
- 3749US2014203191A1Method of Observing Samples with a Fluorescent MicroscopeFEI CO·Filed 2014·Application pending·0 cites
- 3839US9958403B1Arrangement for X-Ray tomographyFEI CO·Filed 2017·Granted May 1, 2018·0 cites·20 claims
- 3939US2005069082A1Scanning x-ray microscope with a plurality of simultaneous x-ray probes on the sampleFiled 2002·Application pending·0 cites
- 4034US9583303B2Aligning a featureless thin film in a TEMFEI CO·Filed 2015·Granted Feb 28, 2017·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →