Inventor · disambiguated record
Barney Drake
Also filed as: DRAKE BARNEY
12 granted patents·1 pending application·779 citations·filing 1989–2015
94Inventor score
Top patents by PatentIndex Score
13 records- 0198USRE34489EAtomic force microscope with optional replaceable fluid cellUNIV CALIFORNIA·Filed 1992·Granted Dec 28, 1993·153 cites·58 claims
- 0298US4935634AAtomic force microscope with optional replaceable fluid cellUNIV CALIFORNIA·Filed 1989·Granted Jun 19, 1990·134 cites·58 claims
- 0395US4924091AScanning ion conductance microscopeUNIV CALIFORNIA·Filed 1989·Granted May 8, 1990·115 cites·11 claims
- 0494US5463897AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1993·Granted Nov 7, 1995·115 cites·41 claims
- 0585US5560244AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1995·Granted Oct 1, 1996·70 cites·7 claims
- 0679US6871527B2Measurement head for atomic force microscopy and other applicationsUNIV CALIFORNIA·Filed 2002·Granted Mar 29, 2005·30 cites·23 claims
- 0779USRE34708EScanning ion conductance microscopeUNIV CALIFORNIA·Filed 1992·Granted Aug 30, 1994·42 cites·14 claims
- 0877US5714682AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1996·Granted Feb 3, 1998·42 cites·15 claims
- 0976US6032518AScanning stylus atomic force microscope with cantilever tracking and optical accessDIGITAL INSTR INC·Filed 1998·Granted Mar 7, 2000·59 cites·20 claims
- 1075US7966866B2Methods and instruments for materials testingUNIV CALIFORNIA·Filed 2008·Granted Jun 28, 2011·17 cites·7 claims
- 1144US10488391B2Neural circuit probeUNIV CALIFORNIA·Filed 2015·Granted Nov 26, 2019·0 cites·20 claims
- 1242US2011303022A1Methods and instruments for material testingHANSMA PAUL·Filed 2011·Application pending·0 cites
- 1326US8087288B1Scanning stylus atomic force microscope with cantilever tracking and optical accessPRATER CRAIG B·Filed 1997·Granted Jan 3, 2012·2 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →