Inventor · disambiguated record
Bart Jozef Janssen
Also filed as: JANSSEN BART · JANSSEN BART JOZEF
23 granted patents·4 pending applications·29 citations·filing 2012–2025
92Inventor score
Files withFEI CO27
Top patents by PatentIndex Score
27 records- 0193US11756762B2Rotating sample holder for random angle sampling in tomographyFEI CO·Filed 2022·Granted Sep 12, 2023·2 cites·15 claims
- 0291US11257656B2Rotating sample holder for random angle sampling in tomographyFEI CO·Filed 2020·Granted Feb 22, 2022·3 cites·21 claims
- 0385US10937625B2Method of imaging a sample using an electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·4 cites·19 claims
- 0482US11417498B2Method of manufacturing a charged particle detectorFEI CO·Filed 2020·Granted Aug 16, 2022·1 cites·20 claims
- 0581US12074007B2Rotating sample holder for random angle sampling in tomographyFEI CO·Filed 2023·Granted Aug 27, 2024·0 cites·15 claims
- 0680US12009176B2Method and system for generating a diffraction imageFEI CO·Filed 2023·Granted Jun 11, 2024·0 cites·9 claims
- 0779US10014158B1Innovative image processing in charged particle microscopyFEI CO·Filed 2017·Granted Jul 3, 2018·5 cites·6 claims
- 0876US8817148B2Method for acquiring data with an image sensorFEI CO·Filed 2012·Granted Aug 26, 2014·3 cites·20 claims
- 0975US10122946B2Method for detecting particulate radiationFEI CO·Filed 2016·Granted Nov 6, 2018·2 cites·13 claims
- 1074US8766214B2Method of preparing and imaging a lamella in a particle-optical apparatusFEI CO·Filed 2013·Granted Jul 1, 2014·3 cites·20 claims
- 1173US11694874B2Method and system for generating a diffraction imageFEI CO·Filed 2021·Granted Jul 4, 2023·0 cites·15 claims
- 1272US10665419B2Intelligent pre-scan in scanning transmission charged particle microscopyFEI CO·Filed 2019·Granted May 26, 2020·1 cites·12 claims
- 1372US10008363B2Method of imaging a specimen using ptychographyFEI CO·Filed 2017·Granted Jun 26, 2018·1 cites·20 claims
- 1471US9202670B2Method of investigating the wavefront of a charged-particle beamFEI CO·Filed 2014·Granted Dec 1, 2015·3 cites·19 claims
- 1569US10825647B2Innovative imaging technique in transmission charged particle microscopyFEI CO·Filed 2019·Granted Nov 3, 2020·1 cites·11 claims
- 1665US11551906B1Time-gated detection, dual-layer SPAD-based electron detectionFEI CO·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 1762US11990315B2Measurement and correction of optical aberrations in charged particle beam microscopyFEI CO·Filed 2022·Granted May 21, 2024·0 cites·20 claims
- 1861US2025323012A1Method for obtaining a tilt series of images of a sample at a plurality of tilt anglesFEI CO·Filed 2025·Application pending·0 cites
- 1961US2025323011A1Charged particle microscope having a charged particle detectorFEI CO·Filed 2025·Application pending·0 cites
- 2060US11742175B2Defective pixel management in charged particle microscopyFEI CO·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 2160US2024402103A1Methods for three-dimensional tomography of elongated samplesFEI CO·Filed 2024·Application pending·0 cites
- 2258US12165835B2Stroboscopic illumination synchronized electron detection and imagingFEI CO·Filed 2021·Granted Dec 10, 2024·0 cites·21 claims
- 2356US2025349501A1Drift compensation for radiation-sensitive specimensFEI CO·Filed 2024·Application pending·0 cites
- 2455US10692691B2Pulse processingFEI CO·Filed 2019·Granted Jun 23, 2020·0 cites·20 claims
- 2554US10389955B2Method for detecting particulate radiationFEI CO·Filed 2018·Granted Aug 20, 2019·0 cites·21 claims
- 2646US10403470B2Pulse processingFEI CO·Filed 2016·Granted Sep 3, 2019·0 cites·20 claims
- 2739US11297276B1Method and system for high speed signal processingFEI CO·Filed 2020·Granted Apr 5, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →