Inventor · disambiguated record
Bastian Niemann
Also filed as: NIEMANN BASTIAN
2 granted patents·52 citations·filing 1997–2001
65Inventor score
Technology areasG21K
Top patents by PatentIndex Score
2 records- 0173US6859516B2Method for examining structures on a semiconductor substrateLEICA MICROSYSTEM LITHOGRAPHY·Filed 2001·Granted Feb 22, 2005·28 cites·15 claims
- 0256US6128364ACondenser-monochromator arrangement for X-radiationLEICA MICROSYS LITHOGRAPHY LTD·Filed 1997·Granted Oct 3, 2000·24 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →