Inventor · disambiguated record
Baohua Niu
Also filed as: NIU BAOHUA
23 granted patents·7 pending applications·22 citations·filing 2004–2025
92Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD23ZEISS CARL SMT GMBH2DOMINGUEZ JUAN E1FLANIGAN KYLE Y1INTEL CORP1
Top patents by PatentIndex Score
30 records- 0195US10753990B2Method and apparatus for measuring magnetic field strengthTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Aug 25, 2020·5 cites·19 claims
- 0288US10727401B2Magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 28, 2020·3 cites·20 claims
- 0386US10672832B2Magnetic detection circuit, MRAM and operation method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 2, 2020·4 cites·20 claims
- 0483US2024365683A1Methods of manufacturing magnetic random access memory, and methods of manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 0581US10685693B2Method for writing to magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Jun 16, 2020·3 cites·20 claims
- 0680US12082511B2Magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Sep 3, 2024·0 cites·20 claims
- 0780US11238911B2Method for writing to magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Feb 1, 2022·1 cites·20 claims
- 0880US2023358829A1Method and apparatus for measuring magnetic field strengthTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Application pending·0 cites
- 0978US2025357165A1Methods of cross-section imaging of an inspection volume in a waferZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 1077US12300293B2Method for writing to magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted May 13, 2025·0 cites·20 claims
- 1177US10883820B2Apparatus and method for metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jan 5, 2021·2 cites·19 claims
- 1272US11762046B2Method and apparatus for measuring magnetic field strengthTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Sep 19, 2023·0 cites·20 claims
- 1372US11374169B2Magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Jun 28, 2022·0 cites·20 claims
- 1471US11727974B2Method for writing to magnetic random access memoryTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Aug 15, 2023·0 cites·20 claims
- 1569US10403385B2Apparatus for memory device testing and field applicationsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 3, 2019·2 cites·20 claims
- 1667US11127788B2Semiconductor device having magnetic tunnel junction (MTJ) stackTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Sep 21, 2021·1 cites·20 claims
- 1763US11525668B2Apparatus and method for metrologyTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Dec 13, 2022·0 cites·20 claims
- 1860US10868079B2Magnetic detection circuit, MRAM and operation method thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted Dec 15, 2020·0 cites·20 claims
- 1955US11114274B2Method and system for testing an integrated circuitZEISS CARL SMT GMBH·Filed 2019·Granted Sep 7, 2021·0 cites·28 claims
- 2052US8687192B2Through silicon imaging and probingNIU BAOHUA·Filed 2011·Granted Apr 1, 2014·1 cites·18 claims
- 2150US2025208208A1Methods and apparatus for fault isolation with scanning electron microcroscope probingINTEL CORP·Filed 2023·Application pending·0 cites
- 2249US10777733B2Method and apparatus for manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Sep 15, 2020·0 cites·20 claims
- 2348US10861574B2Apparatus for memory device testing and field applicationsTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2019·Granted Dec 8, 2020·0 cites·21 claims
- 2446US11062903B2Method and apparatus for manufacturing semiconductor deviceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jul 13, 2021·0 cites·20 claims
- 2544US10861929B2Electronic device including a capacitorTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 8, 2020·0 cites·19 claims
- 2644US10510410B2Method for programming resistive memory cell with AC perturbation AC signal and nonvolatile memory device thereofTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Dec 17, 2019·0 cites·20 claims
- 2742US10345373B2Method for inspecting semiconductor device structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Jul 9, 2019·0 cites·20 claims
- 2839US2006090692A1Generating nano-particles for chemical mechanical planarizationDOMINGUEZ JUAN E·Filed 2004·Application pending·0 cites
- 2937US2007045833A1Copper bump barrier cap to reduce electrical resistanceZHONG TING·Filed 2005·Application pending·0 cites
- 3035US2006147845A1Electrically reconfigurable photolithography mask for semiconductor and micromechanical substratesFLANIGAN KYLE Y·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →