Inventor · disambiguated record
Balwinder Singh Soni
Also filed as: SONI BALWINDER SINGH
8 granted patents·21 citations·filing 2009–2024
81Inventor score
Top patents by PatentIndex Score
8 records- 0188US10393804B2Clock selection circuit and test clock generation circuit for LBIST and ATPG test circuitST MICROELECTRONICS INT NV·Filed 2018·Granted Aug 27, 2019·4 cites·17 claims
- 0286US10944407B1Source synchronous interface with selectable delay on source and delay on destination controlST MICROELECTRONICS INT NV·Filed 2020·Granted Mar 9, 2021·5 cites·34 claims
- 0378US10228420B2Clock selection circuit and test clock generation circuit for LBIST and ATPG test circuitST MICROELECTRONICS INT NV·Filed 2016·Granted Mar 12, 2019·3 cites·22 claims
- 0475US12272416B2ATPG testing method for latch based memories, for area reductionST MICROELECTRONICS INT NV·Filed 2024·Granted Apr 8, 2025·0 cites·15 claims
- 0572US8644447B2System and a method for generating time bases in low power domainPRAKASH CHANDRA BHUSHAN·Filed 2009·Granted Feb 4, 2014·9 cites·23 claims
- 0670US12020760B2ATPG testing method for latch based memories, for area reductionST MICROELECTRONICS INT NV·Filed 2022·Granted Jun 25, 2024·0 cites·20 claims
- 0764US11557364B1ATPG testing method for latch based memories, for area reductionST MICROELECTRONICS INT NV·Filed 2021·Granted Jan 17, 2023·0 cites·19 claims
- 0852US11835991B2Self-test controller, and associated methodST MICROELECTRONICS INT NV·Filed 2021·Granted Dec 5, 2023·0 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →