Inventor · disambiguated record
Benjamin D. Bunday
Also filed as: BUNDAY BENJAMIN D
0 granted patents·2 pending applications·0 citations·filing 2014–2016
Technology areasH10P
Top patents by PatentIndex Score
2 records- 0150US2014206112A1Method for reducing charge in critical dimension-scanning electron microscope metrologySEMATECH INC·Filed 2014·Application pending·0 cites
- 0246US2017040228A1Method for reducing charge in critical dimension-scanning electron microscope metrologyUNIV NEW YORK STATE RES FOUND·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →