Inventor · disambiguated record
Bert Henning Freitag
Also filed as: FREITAG BERT · FREITAG BERT HENNING
19 granted patents·4 pending applications·114 citations·filing 2006–2024
93Inventor score
Files withFEI CO17VON HARRACH HANNO SEBASTIAN2BOTMAN AURELIEN PHILIPPE JEAN MACLOU1FREITAG BERT HENNING1LAZAR SORIN1
Top patents by PatentIndex Score
23 records- 0194US11127562B1System and method for RF pulsed electron beam based STEMFEI CO·Filed 2020·Granted Sep 21, 2021·3 cites·20 claims
- 0294US10224174B1Transmission charged particle microscope with imaging beam rotationFEI CO·Filed 2017·Granted Mar 5, 2019·18 cites·10 claims
- 0394US8080791B2X-ray detector for electron microscopeVON HARRACH HANNO SEBASTIAN·Filed 2009·Granted Dec 20, 2011·28 cites·33 claims
- 0491US11488800B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2021·Granted Nov 1, 2022·2 cites·20 claims
- 0589US8410439B2X-ray detector for electron microscopeVON HARRACH HANNO SEBASTIAN·Filed 2011·Granted Apr 2, 2013·9 cites·21 claims
- 0689US7518121B2Method for determining lens errors in a particle-optical deviceFEI CO·Filed 2006·Granted Apr 14, 2009·14 cites·21 claims
- 0784US8592764B2X-ray detector for electron microscopeFEI CO·Filed 2013·Granted Nov 26, 2013·4 cites·22 claims
- 0884US7825378B2Method for obtaining a scanning transmission image of a sample in a particle-optical apparatusFEI CO·Filed 2008·Granted Nov 2, 2010·15 cites·18 claims
- 0982US10832901B2EELS detection technique in an electron microscopeFEI CO·Filed 2019·Granted Nov 10, 2020·3 cites·15 claims
- 1080US8405027B2Contrast for scanning confocal electron microscopeLAZAR SORIN·Filed 2011·Granted Mar 26, 2013·7 cites·15 claims
- 1180US2025201512A1Live-assisted image acquisition method and system with charged particle microscopyFEI CO·Filed 2024·Application pending·0 cites
- 1278US11211223B1System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopyFEI CO·Filed 2020·Granted Dec 28, 2021·1 cites·20 claims
- 1378US8168948B2Method of machining a work piece with a focused particle beamBOTMAN AURELIEN PHILIPPE JEAN MACLOU·Filed 2009·Granted May 1, 2012·6 cites·24 claims
- 1475US12288667B2Live-assisted image acquisition method and system with charged particle microscopyFEI CO·Filed 2022·Granted Apr 29, 2025·0 cites·20 claims
- 1574US12136532B2Dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imagingFEI CO·Filed 2022·Granted Nov 5, 2024·0 cites·20 claims
- 1671US8993963B2Mounting structures for multi-detector electron microscopesFEI CO·Filed 2014·Granted Mar 31, 2015·1 cites·21 claims
- 1765US2025104958A1Blanker-enhanced moire imagingFEI CO·Filed 2023·Application pending·0 cites
- 1862US2024347314A1Techniques for electron energy loss spectroscopy at high energyFEI CO·Filed 2023·Application pending·0 cites
- 1960US8859966B2Simultaneous electron detectionTIEMEIJER PETER CHRISTIAAN·Filed 2011·Granted Oct 14, 2014·1 cites·15 claims
- 2058US11741730B2Charged particle microscope scan masking for three-dimensional reconstructionFEI CO·Filed 2021·Granted Aug 29, 2023·0 cites·20 claims
- 2158US2014077080A1X-ray Detector for Electron MicroscopeFEI CO·Filed 2013·Application pending·0 cites
- 2256US8389936B2Method for inspecting a sampleFREITAG BERT HENNING·Filed 2010·Granted Mar 5, 2013·2 cites·13 claims
- 2353US12463009B2Method and system for studying samples using a scanning transmission charged particle microscope with reduced beam induced sample damageFEI CO·Filed 2022·Granted Nov 4, 2025·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →