Inventor · disambiguated record
Bernardo Kastrup
Also filed as: KASTRUP BERNARDO
11 granted patents·6 pending applications·40 citations·filing 2006–2024
87Inventor score
Top patents by PatentIndex Score
17 records- 0196US9507907B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2015·Granted Nov 29, 2016·18 cites·20 claims
- 0294US10579772B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2018·Granted Mar 3, 2020·7 cites·20 claims
- 0394US9990462B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2016·Granted Jun 5, 2018·8 cites·21 claims
- 0490US11080459B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2020·Granted Aug 3, 2021·2 cites·20 claims
- 0588US2024403537A1Computational wafer inspectionASML NETHERLANDS BV·Filed 2024·Application pending·0 cites
- 0685US12500063B2Method and apparatus for inspectionASML NETHERLANDS BV·Filed 2024·Granted Dec 16, 2025·0 cites·20 claims
- 0777US12067340B2Computational wafer inspectionASML NETHERLANDS BV·Filed 2021·Granted Aug 20, 2024·0 cites·23 claims
- 0874US11875966B2Method and apparatus for inspectionASML NETHERLANDS BV·Filed 2021·Granted Jan 16, 2024·0 cites·22 claims
- 0966US8259285B2Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint dataTROOST KARS ZEGER·Filed 2006·Granted Sep 4, 2012·5 cites·25 claims
- 1058US11094502B2Method and apparatus for inspectionASML NETHERLANDS BV·Filed 2016·Granted Aug 17, 2021·0 cites·20 claims
- 1147US2010097294A1Apparatus and method for generating and displaying visual contentKASTRUP BERNARDO·Filed 2009·Application pending·0 cites
- 1244US10915689B2Method and apparatus to correct for patterning process errorASML NETHERLANDS BV·Filed 2016·Granted Feb 9, 2021·0 cites·21 claims
- 1343US2010097381A1Method and apparatus for generating visual patternsKASTRUP BERNARDO·Filed 2009·Application pending·0 cites
- 1442US9229336B2Lithographic apparatus and methods for determining an improved configuration of a lithographic apparatusFINDERS JOZEF MARIA·Filed 2012·Granted Jan 5, 2016·0 cites·20 claims
- 1540US2021079519A1Method and apparatus for forming a patterned layer of materialASML NETHERLANDS BV·Filed 2019·Application pending·0 cites
- 1639US2010302129A1System for generating and displaying imagesKASTRUP BERNARDO·Filed 2010·Application pending·0 cites
- 1737US2018299770A1Method and apparatus to correct for patterning process errorASML NETHERLANDS BV·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →