Inventor · disambiguated record
Bjoern Barz
Also filed as: BARZ BJOERN
0 granted patents·8 pending applications·0 citations·filing 2024–2025
Files withZEISS CARL SMT GMBH8
Top patents by PatentIndex Score
8 records- 0159US2025336059A1Computer implemented method for the detection of defects in an object comprising integrated circuit patterns and corresponding computer program product, computer-readable medium and system making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0257US2025191175A1Computer implemented method for generating an aerial image of a photolithography mask using a machine learning modelZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0356US2025155378A1Computer implemented method for defect detection in an imaging dataset of an object comprising integrated circuit patterns using machine learning models with attention mechanismZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0456US2025259293A1Computer implemented method for the detection of defects in an imaging dataset of an object comprising integrated circuit patterns, computer-readable medium, computer program product and a system making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0555US2025045911A1Computer implemented method for defect detection in an object comprising integrated circuit patterns and corresponding computer-readable medium, computer program and systemZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0655US2025216842A1Computer implemented method for defect detection in an imaging dataset of a wafer, corresponding computer-readable medium, computer program product and systems making use of such methodsZEISS CARL SMT GMBH·Filed 2025·Application pending·0 cites
- 0755US2025061563A1Computer implemented method for defect detection in imaging datasets of a portion of an object comprising integrated circuit patterns and corresponding computer-readable medium, computer program and systemZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
- 0855US2025045907A1Computer implemented method for defect detection in an imaging dataset of an object comprising integrated circuit patternsZEISS CARL SMT GMBH·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →