Inventor · disambiguated record
Blake Erickson
Also filed as: ERICKSON BLAKE · ERICKSON BLAKE W
20 granted patents·10 pending applications·17 citations·filing 2010–2025
90Inventor score
Top patents by PatentIndex Score
30 records- 0195US12283503B2Substrate measurement subsystemAPPLIED MATERIALS INC·Filed 2021·Granted Apr 22, 2025·3 cites·20 claims
- 0293US11668602B2Spatial optical emission spectroscopy for etch uniformityAPPLIED MATERIALS INC·Filed 2021·Granted Jun 6, 2023·2 cites·18 claims
- 0389US11284018B1Smart camera substrateAPPLIED MATERIALS INC·Filed 2020·Granted Mar 22, 2022·2 cites·18 claims
- 0485US12442765B2Transmission corrected plasma emission using in-situ optical reflectometryAPPLIED MATERIALS INC·Filed 2024·Granted Oct 14, 2025·0 cites·20 claims
- 0585US12432461B2Smart camera substrateAPPLIED MATERIALS INC·Filed 2024·Granted Sep 30, 2025·0 cites·20 claims
- 0683USD977504SPortion of a display panel with a graphical user interfaceAPPLIED MATERIALS INC·Filed 2020·Granted Feb 7, 2023·10 cites·1 claims
- 0781US12114083B2Smart camera substrateAPPLIED MATERIALS INC·Filed 2023·Granted Oct 8, 2024·0 cites·18 claims
- 0880US12405164B2Spatial optical emission spectroscopy for etch uniformityAPPLIED MATERIALS INC·Filed 2023·Granted Sep 2, 2025·0 cites·20 claims
- 0977US2024429077A1Low open area and coupon endpoint detectionAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1077US2024420975A1Low open area and coupon endpoint detectionAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1174US11736818B2Smart camera substrateAPPLIED MATERIALS INC·Filed 2022·Granted Aug 22, 2023·0 cites·18 claims
- 1273US12031910B2Transmission corrected plasma emission using in-situ optical reflectometryAPPLIED MATERIALS INC·Filed 2021·Granted Jul 9, 2024·0 cites·21 claims
- 1372US12191176B2Integrated substrate measurement system to improve manufacturing process performanceAPPLIED MATERIALS INC·Filed 2023·Granted Jan 7, 2025·0 cites·16 claims
- 1472US2024290592A1Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wallAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1571US2024096715A1In-situ etch material selectivity detection systemAPPLIED MATERIALS INC·Filed 2023·Application pending·0 cites
- 1670US11927543B2Multiple reflectometry for measuring etch parametersAPPLIED MATERIALS INC·Filed 2023·Granted Mar 12, 2024·0 cites·20 claims
- 1770US2025218829A1Substrate measurement subsystemAPPLIED MATERIALS INC·Filed 2025·Application pending·0 cites
- 1867US2025391006A1Implementing features generated using discrete effective medium refractive analysis of patterned substratesAPPLIED MATERIALS INC·Filed 2024·Application pending·0 cites
- 1966US12080574B2Low open area and coupon endpoint detectionAPPLIED MATERIALS INC·Filed 2020·Granted Sep 3, 2024·0 cites·16 claims
- 2064US11830779B2In-situ etch material selectivity detection systemAPPLIED MATERIALS INC·Filed 2021·Granted Nov 28, 2023·0 cites·13 claims
- 2163US11688616B2Integrated substrate measurement system to improve manufacturing process performanceAPPLIED MATERIALS INC·Filed 2021·Granted Jun 27, 2023·0 cites·10 claims
- 2263US11619594B2Multiple reflectometry for measuring etch parametersAPPLIED MATERIALS INC·Filed 2021·Granted Apr 4, 2023·0 cites·19 claims
- 2360US12009191B2Thin film, in-situ measurement through transparent crystal and transparent substrate within processing chamber wallAPPLIED MATERIALS INC·Filed 2020·Granted Jun 11, 2024·0 cites·19 claims
- 2459US2023062206A1Determining substrate profile properties using machine learningAPPLIED MATERIALS INC·Filed 2022·Application pending·0 cites
- 2558US12469686B2Process characterization and correction using optical wall process sensor (OWPS)APPLIED MATERIALS INC·Filed 2022·Granted Nov 11, 2025·0 cites·20 claims
- 2653US2022026817A1Determining substrate profile properties using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 2750US12489022B2In-situ etch rate and etch rate uniformity detection systemAPPLIED MATERIALS INC·Filed 2021·Granted Dec 2, 2025·0 cites·17 claims
- 2849US2022066411A1Detecting and correcting substrate process drift using machine learningAPPLIED MATERIALS INC·Filed 2021·Application pending·0 cites
- 2945US2020340858A1Plasma emission monitoring system with cross-dispersion gratingAPPLIED MATERIALS INC·Filed 2020·Application pending·0 cites
- 3027US8568692B2Method for analyzing collagenous tissues for the detection and diagnosis of bone diseaseBANASZAK-HOLL MARK·Filed 2010·Granted Oct 29, 2013·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →