Inventor · disambiguated record
Bo Hou
Also filed as: HOU BO · HOU BO-YU
6 granted patents·1 pending application·0 citations·filing 2016–2025
63Inventor score
Files withFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH3CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON2CHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES1IND TECH RES INST1
Top patents by PatentIndex Score
7 records- 0167US12066468B1Method and device for detecting system failure, computer device, and storage mediumCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2024·Granted Aug 20, 2024·0 cites·20 claims
- 0262US12301097B2Fault prediction method and apparatus for power conversion device, and power conversion systemCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2023·Granted May 13, 2025·0 cites·10 claims
- 0357US12339310B1Method for monitoring degradation mechanism of switch device in power conversion circuitCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Granted Jun 24, 2025·0 cites·8 claims
- 0446US2024207678A1Auxiliary system and method for motion guidanceIND TECH RES INST·Filed 2022·Application pending·0 cites
- 0537US11231702B2Method, device and system for health monitoring of system-on-chipFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Jan 25, 2022·0 cites·8 claims
- 0634US10598713B2ESD failure early warning circuit for integrated circuitFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Mar 24, 2020·0 cites·11 claims
- 0731US10503578B2On-chip TDDB degradation monitoring and failure early warning circuit for SoCFIFTH ELECTRONICS RESEARCH INSTITUTE OF MINISTRY OF INDUSTRY AND INFORMATION TECH·Filed 2016·Granted Dec 10, 2019·0 cites·10 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →