Inventor · disambiguated record
Boaz Kenan
Also filed as: KENAN BOAZ
15 granted patents·583 citations·filing 1994–2008
95Inventor score
Top patents by PatentIndex Score
15 records- 0197US6268093B1Method for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 1999·Granted Jul 31, 2001·205 cites·32 claims
- 0294US7133548B2Method and apparatus for reticle inspection using aerial imagingAPPLIED MATERIALS INC·Filed 2001·Granted Nov 7, 2006·53 cites·31 claims
- 0392US6466315B1Method and system for reticle inspection by photolithography simulationAPPLIED MATERIALS INC·Filed 1999·Granted Oct 15, 2002·131 cites·17 claims
- 0488US6587194B2Method of and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2002·Granted Jul 1, 2003·19 cites·6 claims
- 0587US6798505B2Method and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2003·Granted Sep 28, 2004·20 cites·5 claims
- 0687US6429931B1Method and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2002·Granted Aug 6, 2002·20 cites·9 claims
- 0785US7072502B2Alternating phase-shift mask inspection method and apparatusAPPLIED MATERIALS INC·Filed 2001·Granted Jul 4, 2006·32 cites·33 claims
- 0885US6924891B2Method and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2004·Granted Aug 2, 2005·16 cites·22 claims
- 0983US7355689B2Automatic optical inspection using multiple objectivesAPPLIED MATERIALS INC·Filed 2005·Granted Apr 8, 2008·7 cites·28 claims
- 1083US5594556AScanner having a misalignment detectorSCITEX CORP LTD·Filed 1994·Granted Jan 14, 1997·61 cites·10 claims
- 1181US7463352B2Method and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2005·Granted Dec 9, 2008·4 cites·24 claims
- 1275US7599075B2Automatic optical inspection using multiple objectivesAPPLIED MATERIALS ISRAEL LTD·Filed 2008·Granted Oct 6, 2009·3 cites·20 claims
- 1373US6556294B2Method of and apparatus for article inspection including speckle reductionAPPLIED MATERIALS INC·Filed 2002·Granted Apr 29, 2003·6 cites·20 claims
- 1472US7394531B2Apparatus and method for automatic optical inspectionAPPLIED MATERIALS INC·Filed 2006·Granted Jul 1, 2008·2 cites·20 claims
- 1530US5861904AImage-setter for multiple media exposureSCITEX CORP LTD·Filed 1995·Granted Jan 19, 1999·4 cites·34 claims
Join the waitlist — get patent alerts
Get an alert when Boaz Kenan files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →