Inventor · disambiguated record
Bohuslav Sed'A
Also filed as: SED'A BOHUSLAV · SEDA BOHUSLAV
10 granted patents·6 pending applications·17 citations·filing 2012–2024
82Inventor score
Top patents by PatentIndex Score
16 records- 0182US9362086B2In-column detector for particle-optical columnFEI CO·Filed 2013·Granted Jun 7, 2016·7 cites·21 claims
- 0281US10784076B23D defect characterization of crystalline samples in a scanning type electron microscopeFEI CO·Filed 2018·Granted Sep 22, 2020·4 cites·19 claims
- 0381US9741525B1Charged-particle microscope with astigmatism compensation and energy-selectionFEI CO·Filed 2016·Granted Aug 22, 2017·3 cites·16 claims
- 0477US10937627B2Multi-beam electron microscopeFEI CO·Filed 2019·Granted Mar 2, 2021·2 cites·15 claims
- 0561US12106933B2Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopesFEI CO·Filed 2022·Granted Oct 1, 2024·0 cites·14 claims
- 0659US9053899B2Method for imaging a sample in a charged particle apparatusFEI CO·Filed 2014·Granted Jun 9, 2015·1 cites·11 claims
- 0756US12057287B2Methods and systems for aligning a multi-beam systemFEI CO·Filed 2022·Granted Aug 6, 2024·0 cites·20 claims
- 0853US2025191873A1Objective lenses, charged particle microscopes including the same, and associated methodsFEI CO·Filed 2023·Application pending·0 cites
- 0952US2025157779A1Minimization of energy spread in focused ion beam (fib) systemsFEI CO·Filed 2023·Application pending·0 cites
- 1052US2025357071A1Scanning deflectorFEI CO·Filed 2024·Application pending·0 cites
- 1151US11676795B2Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2021·Granted Jun 13, 2023·0 cites·18 claims
- 1249US12380596B2Method and system for determining beam positionFEI CO·Filed 2021·Granted Aug 5, 2025·0 cites·18 claims
- 1349US2012273677A1In-column detector for particle-optical columnTUMA LUBOMIR·Filed 2012·Application pending·0 cites
- 1448US10790113B2Multi-beam charged particle imaging apparatusFEI CO·Filed 2019·Granted Sep 29, 2020·0 cites·15 claims
- 1545US2020312610A1Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2020·Application pending·0 cites
- 1633US2018061613A1Charged-particle microscope with exchangeable pole piece extending elementFEI CO·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →