Inventor · disambiguated record
Boris Sherman
Also filed as: SHERMAN BORIS
7 granted patents·5 pending applications·19 citations·filing 2003–2024
77Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD4BRILL BOAZ3DALLA-TORRE MICHELE1DOLPHIN MEASUREMENT SYSTEM LLC1INESA EAST LTD1
Top patents by PatentIndex Score
12 records- 0175US10295329B2Monitoring system and method for verifying measurements in patterned structuresBRILL BOAZ·Filed 2012·Granted May 21, 2019·3 cites·21 claims
- 0270US12152869B2Monitoring system and method for verifying measurements in patterned structuresNOVA LTD·Filed 2021·Granted Nov 26, 2024·0 cites·22 claims
- 0367US9367911B2Apparatus and method for defect detection including patch-to-patch comparisonsDALLA-TORRE MICHELE·Filed 2012·Granted Jun 14, 2016·4 cites·20 claims
- 0456US2019339056A1Monitoring system and method for verifying measurements in pattened structuresNOVA MEASURING INSTR LTD·Filed 2019·Application pending·0 cites
- 0551US12423800B2Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Sep 23, 2025·0 cites·20 claims
- 0648US12400319B2Defect examination on a semiconductor specimenAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Aug 26, 2025·0 cites·18 claims
- 0748US6836449B2Acoustic method and device for distance measurementINESA EAST LTD·Filed 2003·Granted Dec 28, 2004·12 cites·22 claims
- 0844US2025272824A1Unsupervised method to increase signal-to-noise-ratio of defects in an inspection systemAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0944US2024428396A1Machine learning based defect examination for semiconductor specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 1036US2013124141A1Method and system for measuring in patterned structuresBRILL BOAZ·Filed 2011·Application pending·0 cites
- 1136US2013282343A1Method and system for use in measuring in complex patterned structuresBRILL BOAZ·Filed 2012·Application pending·0 cites
- 1230US11340343B2Apparatus and methods for thickness and velocity measurement of flat moving materials using high frequency radar technologiesDOLPHIN MEASUREMENT SYSTEM LLC·Filed 2018·Granted May 24, 2022·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →