Inventor · disambiguated record
Boris Verman
Also filed as: VERMAN BORIS
22 granted patents·2 pending applications·568 citations·filing 1998–2021
96Inventor score
Files withOSMIC INC10RIGAKU DENKI CO LTD5VERMAN BORIS5RIGAKU INNOVATIVE TECHNOLOGIES2OMOTE KAZUHIKO1
Top patents by PatentIndex Score
24 records- 0193US6504902B2X-ray optical device and multilayer mirror for small angle scattering systemRIGAKU DENKI CO LTD·Filed 2001·Granted Jan 7, 2003·74 cites·8 claims
- 0293US6041099ASingle corner kirkpatrick-baez beam conditioning optic assemblyOSMIC INC·Filed 1998·Granted Mar 21, 2000·92 cites·20 claims
- 0390US9336917B2X-ray apparatus, method of using the same and X-ray irradiation methodOZAWA TETSUYA·Filed 2010·Granted May 10, 2016·12 cites·12 claims
- 0487US8488743B2Nanotube based device for guiding X-ray photons and neutronsVERMAN BORIS·Filed 2012·Granted Jul 16, 2013·12 cites·17 claims
- 0587US8249220B2Multiconfiguration X-ray optical systemVERMAN BORIS·Filed 2009·Granted Aug 21, 2012·28 cites·7 claims
- 0687US6069934AX-ray diffractometer with adjustable image distanceOSMIC INC·Filed 1998·Granted May 30, 2000·78 cites·32 claims
- 0786US10876978B2X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curveRIGAKU DENKI CO LTD·Filed 2017·Granted Dec 29, 2020·8 cites·10 claims
- 0884US8126117B2Multi-beam X-ray systemVERMAN BORIS·Filed 2010·Granted Feb 28, 2012·9 cites·14 claims
- 0982US10436723B2X-ray diffractometer with multilayer reflection-type monochromatorRIGAKU DENKI CO LTD·Filed 2015·Granted Oct 8, 2019·2 cites·12 claims
- 1080US7076026B2Beam conditioning systemOSMIC INC·Filed 2004·Granted Jul 11, 2006·21 cites·28 claims
- 1179US6014423AMultiple corner Kirkpatrick-Baez beam conditioning optic assemblyOSMIC INC·Filed 1998·Granted Jan 11, 2000·75 cites·16 claims
- 1278US7933383B2X-ray generator with polycapillary opticRIGAKU INNOVATIVE TECHNOLOGIES·Filed 2009·Granted Apr 26, 2011·5 cites·18 claims
- 1375US6643353B2Protective layer for multilayers exposed to x-raysOSMIC INC·Filed 2002·Granted Nov 4, 2003·18 cites·45 claims
- 1471US10854348B2X-ray generator and x-ray analysis deviceRIGAKU DENKI CO LTD·Filed 2019·Granted Dec 1, 2020·2 cites·5 claims
- 1571US7245699B2X-ray optical system with adjustable convergenceOSMIC INC·Filed 2004·Granted Jul 17, 2007·13 cites·20 claims
- 1670US6421417B1Multilayer optics with adjustable working wavelengthOSMIC INC·Filed 1999·Granted Jul 16, 2002·33 cites·22 claims
- 1767US9031203B2X-ray beam system offering 1D and 2D beamsRIGAKU INNOVATIVE TECHNOLOGIES·Filed 2013·Granted May 12, 2015·2 cites·19 claims
- 1866US7280634B2Beam conditioning system with sequential opticOSMIC INC·Filed 2006·Granted Oct 9, 2007·4 cites·13 claims
- 1964US8767918B2X-ray scattering measurement device and X-ray scattering measurement methodOMOTE KAZUHIKO·Filed 2010·Granted Jul 1, 2014·2 cites·16 claims
- 2061US6389100B1X-ray lens systemOSMIC INC·Filed 1999·Granted May 14, 2002·78 cites·30 claims
- 2158US11867646B2Total reflection x-ray fluorescence spectrometerRIGAKU DENKI CO LTD·Filed 2021·Granted Jan 9, 2024·0 cites·8 claims
- 2246US2011280530A1X-ray generator with polycapillary opticVERMAN BORIS·Filed 2011·Application pending·0 cites
- 2338US8406374B2X-ray optical systems with adjustable convergence and focal spot sizeVERMAN BORIS·Filed 2010·Granted Mar 26, 2013·0 cites·17 claims
- 2438US2003128811A1X-ray lens systemOSMIC INC·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →