Inventor · disambiguated record
Brian R. Bobrzynski
Also filed as: BOBRZYNSKI BRIAN R
2 granted patents·2 citations·filing 2004–2004
38Inventor score
Technology areasG01R
Files withSOLID STATE MEASUREMENTS INC2
Top patents by PatentIndex Score
2 records- 0135US7304490B2In-situ wafer and probe desorption using closed loop heatingSOLID STATE MEASUREMENTS INC·Filed 2004·Granted Dec 4, 2007·1 cites·19 claims
- 0235US7190186B2Method and apparatus for determining concentration of defects and/or impurities in a semiconductor waferSOLID STATE MEASUREMENTS INC·Filed 2004·Granted Mar 13, 2007·1 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →