Inventor · disambiguated record
Brian H. Stevens
Also filed as: STEVENS BRIAN · STEVENS BRIAN H
1 granted patent·2 pending applications·6 citations·filing 2005–2015
30Inventor score
Top patents by PatentIndex Score
3 records- 0170US9240042B2Wafer slip detection during CMP processingGLOBALFOUNDRIES INC·Filed 2013·Granted Jan 19, 2016·6 cites·13 claims
- 0241US2007062561A1Method And Apparatus For Testing Particulate Contamination In Wafer CarriersIBM·Filed 2005·Application pending·0 cites
- 0336US2016082566A1Wafer slip detection during cmp processingGLOBALFOUNDRIES INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →