Inventor · disambiguated record
Bruce W. Worster
Also filed as: WORSTER BRUCE · WORSTER BRUCE W
10 granted patents·1,120 citations·filing 1993–2006
93Inventor score
Top patents by PatentIndex Score
10 records- 0198US5479252ALaser imaging system for inspection and analysis of sub-micron particlesULTRAPOINTE CORP·Filed 1993·Granted Dec 26, 1995·343 cites·29 claims
- 0297US5963314ALaser imaging system for inspection and analysis of sub-micron particlesULTRAPOINTE CORP·Filed 1996·Granted Oct 5, 1999·258 cites·51 claims
- 0394US6288782B1Method for characterizing defects on semiconductor wafersULTRAPOINTE CORP·Filed 1999·Granted Sep 11, 2001·110 cites·18 claims
- 0493US5808735AMethod for characterizing defects on semiconductor wafersULTRAPOINTE CORP·Filed 1996·Granted Sep 15, 1998·146 cites·14 claims
- 0590US6661515B2Method for characterizing defects on semiconductor wafersKLA TENCOR CORP·Filed 2001·Granted Dec 9, 2003·42 cites·20 claims
- 0689US5923430AMethod for characterizing defects on semiconductor wafersULTRAPOINTE CORP·Filed 1997·Granted Jul 13, 1999·63 cites·25 claims
- 0788US6069690AIntegrated laser imaging and spectral analysis systemUNIPHASE CORP·Filed 1998·Granted May 30, 2000·102 cites·10 claims
- 0884US7384806B2Method for characterizing defects on semiconductor wafersKLA TENCOR CORP·Filed 2006·Granted Jun 10, 2008·9 cites·36 claims
- 0972US7154605B2Method for characterizing defects on semiconductor wafersKLA TENCOR CORP·Filed 2003·Granted Dec 26, 2006·10 cites·26 claims
- 1066US6167148AMethod and system for inspecting the surface of a waferULTRAPOINTE CORP·Filed 1998·Granted Dec 26, 2000·37 cites·25 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →