Inventor · disambiguated record
Burnell G. West
Also filed as: WEST BURNELL · WEST BURNELL G
37 granted patents·4 pending applications·1,266 citations·filing 1982–2007
98Inventor score
Files withCREDENCE SYSTEMS CORP14SCHLUMBERGER TECHNOLOGIES INC9DYNA LOGIC CORP3DYNACHIP CORP2FAIRCHILD CAMERA INSTR CO2
Top patents by PatentIndex Score
41 records- 0197US6002268AFPGA with conductors segmented by active repeatersDYNACHIP CORP·Filed 1997·Granted Dec 14, 1999·168 cites·32 claims
- 0296US5475624ATest generation by environment emulationSCHLUMBERGER TECHNOLOGIES INC·Filed 1992·Granted Dec 12, 1995·138 cites·28 claims
- 0396US5397943AClock distribution method and apparatus for high speed circuits with low skew using counterpropaging true and complement re-generated clock signals with predetermined ramp shapesDYNA LOGIC CORP·Filed 1993·Granted Mar 14, 1995·78 cites·8 claims
- 0491US7761751B1Test and diagnosis of semiconductorsCREDENCE SYSTEMS CORP·Filed 2007·Granted Jul 20, 2010·19 cites·20 claims
- 0591US6501706B1Time-to-digital converterFiled 2000·Granted Dec 31, 2002·43 cites·52 claims
- 0691US5212443AEvent sequencer for automatic test equipmentSCHLUMBERGER TECHNOLOGIES INC·Filed 1990·Granted May 18, 1993·79 cites·19 claims
- 0789US5355035AHigh speed BICMOS switches and multiplexersVORA MADHUKAR B·Filed 1993·Granted Oct 11, 1994·43 cites·6 claims
- 0888US4497998ATemperature stabilized stop-restart oscillatorFAIRCHILD CAMERA INSTR CO·Filed 1982·Granted Feb 5, 1985·47 cites·4 claims
- 0986US6859902B1Method and apparatus for high speed IC test interfaceCREDENCE SYSTEMS CORP·Filed 2000·Granted Feb 22, 2005·36 cites·7 claims
- 1086US5477139AEvent sequencer for automatic test equipmentSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Dec 19, 1995·53 cites·16 claims
- 1185US7093177B2Low-jitter clock for test systemSCHLUMBERGER TECHNOLOGIES INC·Filed 2002·Granted Aug 15, 2006·35 cites·36 claims
- 1285US4849702ATest period generator for automatic test equipmentSCHLUMBERGER TECHOLOGIES INC·Filed 1988·Granted Jul 18, 1989·58 cites·26 claims
- 1384US6940271B2Pin electronics interface circuitNPTEST INC·Filed 2002·Granted Sep 6, 2005·25 cites·19 claims
- 1484US6748564B1Scan stream sequencing for testing integrated circuitsNPTEST LLC·Filed 2000·Granted Jun 8, 2004·32 cites·8 claims
- 1583US5430400ADriver circuits for IC testerSCHLUMBERGER TECHNOLOGIES INC·Filed 1993·Granted Jul 4, 1995·56 cites·7 claims
- 1682US7765443B1Test systems and methods for integrated circuit devicesCREDENCE SYSTEMS CORP·Filed 2004·Granted Jul 27, 2010·28 cites·19 claims
- 1782US7035755B2Circuit testing with ring-connected test instrument modulesCREDENCE SYSTEMS CORP·Filed 2002·Granted Apr 25, 2006·24 cites·33 claims
- 1881US6937006B2Pin electronics interface circuitCREDENCE SYSTEMS CORP·Filed 2004·Granted Aug 30, 2005·20 cites·17 claims
- 1979US6622107B1Edge placement and jitter measurement for electronic elementsNPTEST LLC·Filed 2000·Granted Sep 16, 2003·23 cites·27 claims
- 2077US7454678B2Scan stream sequencing for testing integrated circuitsCREDENCE SYSTEMS CORP·Filed 2005·Granted Nov 18, 2008·7 cites·8 claims
- 2177US7113886B2Circuit and method for distributing events in an event streamCREDENCE SYSTEMS CORP·Filed 2002·Granted Sep 26, 2006·20 cites·27 claims
- 2276US6025736AFast reprogrammable logic with active links between cellsDYNALOGIC·Filed 1997·Granted Feb 15, 2000·34 cites·17 claims
- 2374US5406133ABICMOS reprogrammable logicDYNA LOGIC CORP·Filed 1994·Granted Apr 11, 1995·17 cites·1 claims
- 2468US5570059ABiCMOS multiplexers and crossbar switchesDYNA LOGIC CORP·Filed 1995·Granted Oct 29, 1996·16 cites·3 claims
- 2567US7222280B1Diagnostic process for automated test equipmentCREDENCE SYSTEMS CORP·Filed 2004·Granted May 22, 2007·20 cites·20 claims
- 2667US6128754ATester having event generation circuit for acquiring waveform by supplying strobe events for waveform acquisition rather than using strobe events specified by the test programSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted Oct 3, 2000·29 cites·34 claims
- 2767US6081484AMeasuring signals in a tester systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted Jun 27, 2000·24 cites·17 claims
- 2866US5668495ABiCMOS reprogrammable logicDYNACHIP CORP·Filed 1996·Granted Sep 16, 1997·15 cites·9 claims
- 2961US7017091B2Test system formatters configurable for multiple data ratesCREDENCE SYSTEMS CORP·Filed 2002·Granted Mar 21, 2006·9 cites·43 claims
- 3060US7143326B2Test system algorithmic program generatorsCREDENCE SYSTEMS CORP·Filed 2002·Granted Nov 28, 2006·10 cites·51 claims
- 3156US6014764AProviding test vectors with pattern chaining definitionSCHLUMBERGER TECHNOLOGIES INC·Filed 1997·Granted Jan 11, 2000·22 cites·48 claims
- 3255US6928387B1Circuit and method for distributing events in an event streamCREDENCE SYSTEMS CORP·Filed 2004·Granted Aug 9, 2005·3 cites·22 claims
- 3351US7212941B2Non-deterministic protocol packet testingCREDENCE SYSTEMS CORP·Filed 2004·Granted May 1, 2007·4 cites·20 claims
- 3447US7336066B2Reduced pin count test method and apparatusCREDENCE SYSTEMS CORP·Filed 2004·Granted Feb 26, 2008·3 cites·17 claims
- 3547US6285963B1Measuring signals in a tester systemSCHLUMBERGER TECHNOLOGIES INC·Filed 1999·Granted Sep 4, 2001·10 cites·5 claims
- 3647US4550405ADeskew circuit for automatic test equipmentFAIRCHILD CAMERA INSTR CO·Filed 1982·Granted Oct 29, 1985·13 cites·13 claims
- 3746US7171598B2Tester system having a multi-purpose memoryCREDENCE SYSTEMS CORP·Filed 2003·Granted Jan 30, 2007·5 cites·35 claims
- 3846US2006129350A1Biphase vernier time code generatorWEST BURNELL G·Filed 2004·Application pending·0 cites
- 3937US2004255212A1Scan stream sequencing for testing integrated circuitsFiled 2004·Application pending·0 cites
- 4036US2004187049A1Very small pin count IC testerNPTEST INC·Filed 2003·Application pending·0 cites
- 4133US2005222789A1Automatic test systemWEST BURNELL G·Filed 2004·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →